Experimental comparison of wafer level reliability (WLR) and packaged electromigration tests
Ryu, C., Tse-Lun Tsai, Rogers, A., Jesse, C., Brozek, T., Zarr, D., Adamson, M., Nayak, S., Walls, J.
Published in 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) (2001)
Published in 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) (2001)
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Conference Proceeding
Optical constants of GaAs from 0.73 to 6.60 eV for dielectric film thickness metrology in compound semiconductor manufacturing
Zollner, S., Zarr, D.
Published in 2000 IEEE International Symposium on Compound Semiconductors. Proceedings of the IEEE Twenty-Seventh International Symposium on Compound Semiconductors (Cat. No.00TH8498) (2000)
Published in 2000 IEEE International Symposium on Compound Semiconductors. Proceedings of the IEEE Twenty-Seventh International Symposium on Compound Semiconductors (Cat. No.00TH8498) (2000)
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Conference Proceeding