Vector Network Analyzer Calibration Using a Line and Two Offset Reflecting Loads
Pulido-Gaytan, M. A., Reynoso-Hernandez, J. A., Zarate-de Landa, A., Loo-Yau, J. R., del Carmen Maya-Sanchez, M.
Published in IEEE transactions on microwave theory and techniques (01.09.2013)
Published in IEEE transactions on microwave theory and techniques (01.09.2013)
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Journal Article
Artificial Neural Network Model of SOS-MOSFETs Based on Dynamic Large-Signal Measurements
Youngseo Ko, Roblin, Patrick, Zarate-de Landa, Andres, Apolinar Reynoso-Hernandez, J., Nobbe, Dan, Olson, Chris, Martinez, Francisco Javier
Published in IEEE transactions on microwave theory and techniques (01.03.2014)
Published in IEEE transactions on microwave theory and techniques (01.03.2014)
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Journal Article
Generalized Theory of the Thru-Reflect-Match Calibration Technique
Pulido-Gaytan, Manuel Alejandro, Apolinar Reynoso-Hernandez, J., Loo-Yau, Jose Raul, Zarate-de Landa, Andres, Maya-Sanchez, Maria del Carmen
Published in IEEE transactions on microwave theory and techniques (01.05.2015)
Published in IEEE transactions on microwave theory and techniques (01.05.2015)
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Journal Article
An investigation on the modified cold-fet method for determining the gate resistance and inductance of the packaged GaN and SiC transistors
Landa, Andres Zarate-de, Zuniga-Juarez, J.E., Reynoso-Hernandez, J.A., Maya-Sanchez, M.C., del Valle-Padilla, Juan Luis, Loo-Yau, J. R.
Published in 2007 70th ARFTG Microwave Measurement Conference (ARFTG) (01.11.2007)
Published in 2007 70th ARFTG Microwave Measurement Conference (ARFTG) (01.11.2007)
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Conference Proceeding
A new method for determining the gate resistance and inductance of GaN HEMTs based on the extrema points of Z11 curves
Reynoso-Hernandez, J.A., Zuniga-Juarez, J.E., Zarate-de Landa, Andres
Published in 2008 IEEE MTT-S International Microwave Symposium Digest (01.06.2008)
Published in 2008 IEEE MTT-S International Microwave Symposium Digest (01.06.2008)
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Conference Proceeding
A neural network approach to smooth calibrated data corrupted from switching errors
Landa, A. Z., Pulido-Gaytan, M. A., Reynoso-Hernandez, J. A., Roblin, P., Loo-Yau, J. R.
Published in 80th ARFTG Microwave Measurement Conference (01.11.2012)
Published in 80th ARFTG Microwave Measurement Conference (01.11.2012)
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Conference Proceeding
On the determination of neural network based non-linear constitutive relations for quasi-static GaN FET models
Zarate-de Landa, Andres, Reynoso-Hernandez, J. A., Roblin, Patrick, Pulido-Gaytan, M. A., Monjardin-Lopez, J. R., Loo-Yau, J. R.
Published in 82nd ARFTG Microwave Measurement Conference (01.11.2013)
Published in 82nd ARFTG Microwave Measurement Conference (01.11.2013)
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Conference Proceeding
A new method for determining the characteristic impedance Zc of transmission lines embedded in symmetrical transitions
Zuniga-Juarez, J. E., Reynoso-Hernandez, J. A., Zarate-de Landa, Andres
Published in 2008 71st ARFTG Microwave Measurement Conference (01.06.2008)
Published in 2008 71st ARFTG Microwave Measurement Conference (01.06.2008)
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Conference Proceeding
Advances in Linear Modeling of Microwave Transistors
Zarate-de Landa, A., Zuniga-Juarez, J., Loo-Yau, J., Reynoso-Hernandez, J., Maya-Sanchez, M., del Valle-Padilla, J.
Published in IEEE microwave magazine (01.04.2009)
Published in IEEE microwave magazine (01.04.2009)
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Magazine Article
A New and Better Method for Extracting the Parasitic Elements of On-Wafer GaN Transistors
Zarate-de Landa, A., Zuniga-Juarez, J.E., Reynoso-Hernandez, J.A., Maya-Sanchez, M.C., Piner, E.L., Linthicum, K.J.
Published in 2007 IEEE/MTT-S International Microwave Symposium (01.06.2007)
Published in 2007 IEEE/MTT-S International Microwave Symposium (01.06.2007)
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Conference Proceeding