Direct temperature measurement for VLSI circuits and 3-D modeling of self-heating in sub-0.13 /spl mu/m SOI technologies
Joshi, R.V., Kang, S.S., Zamclmar, N., Mocuta, A., Chuang, C.T., Pascual-Gutierrez, J.A.
Published in 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design (2005)
Published in 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design (2005)
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