Diffusion in strained Si(Ge)
Cowern, NE, Zalm, PC, van der Sluis P, Gravesteijn, DJ, de Boer WB
Published in Physical review letters (18.04.1994)
Published in Physical review letters (18.04.1994)
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Medium energy ion scattering analysis of the evolution and annealing of damage and associated dopant redistribution of ultra shallow implants in Si
van den Berg, J. A., Reading, M. A., Armour, D. G., Carter, G., Zalm, P. C., Bailey, P., Noakes, T. C.Q.
Published in Radiation effects and defects in solids (01.08.2009)
Published in Radiation effects and defects in solids (01.08.2009)
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Oxygen-mediated Mn diffusion in magnetic tunnel junctions comprising a nano-oxide layer
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Conference Proceeding
Fluorescence-based photoelectron features in Auger spectra
Zalm, P. C., Toussaint, S. L. G., Crombeen, J. E.
Published in Surface and interface analysis (01.09.2000)
Published in Surface and interface analysis (01.09.2000)
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X-ray-induced Metal Reduction in Polymer Hosts
Vreugdenhil, F., Hagenhoff, B., Zalm, P. C.
Published in Surface and interface analysis (01.01.1997)
Published in Surface and interface analysis (01.01.1997)
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Problems in the deconvolution of SIMS depth profiles using delta-doped test structures
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Conference Proceeding
An effective barrier against the interdiffusion of iron and zinc dopants in InP
YOUNG, E. W. A, FONTIJN, G. M, VRIEZEMA, C. J, ZAIM, P. C
Published in Journal of applied physics (01.10.1991)
Published in Journal of applied physics (01.10.1991)
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Ge Segregation during molecular beam epitaxial growth of Si1−xGex/Si layers
Gravesteijn, D.J., Zalm, P.C., van de Walle, G.F.A., Vriezema, C.J., van Gorkum, A.A., van Ijzendoorn, L.J.
Published in Thin solid films (30.12.1989)
Published in Thin solid films (30.12.1989)
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