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Electrical conduction of silicon oxide containing silicon quantum dots

Electrical conduction of silicon oxide containing silicon quantum dots

by Pi, X D, Zalloum, O H Y, Knights, A P, Mascher, P, Simpson, P J
Published in Journal of physics. Condensed matter (01.11.2006)

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Birefringence-based eye fixation monitor with no moving parts

Birefringence-based eye fixation monitor with no moving parts

by Gramatikov, B I, Zalloum, O H Y, Wu, Y K, Hunter, D G, Guyton, D L
Published in Journal of biomedical optics (01.05.2006)

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Light Emission from Rare-Earth Doped Silicon Nanostructures

Light Emission from Rare-Earth Doped Silicon Nanostructures

by Li, J., Zalloum, O. H. Y., Roschuk, T., Heng, C. L., Wojcik, J., Mascher, P.
Published in Advances in optical technologies (2008)

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$X-ray-diffraction study of crystalline Si nanocluster formation in annealed silicon-rich silicon oxides$

X-ray-diffraction study of crystalline Si nanocluster formation in annealed silicon-rich silicon oxides

by Comedi, D., Zalloum, O. H. Y., Irving, E. A., Wojcik, J., Roschuk, T., Flynn, M. J., Mascher, P.
Published in Journal of applied physics (15.01.2006)

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On the effects of double-step anneal treatments on light emission from Er-doped Si-rich silicon oxide

On the effects of double-step anneal treatments on light emission from Er-doped Si-rich silicon oxide

by Heng, C. L., Zalloum, O. H. Y., Wojcik, J., Roschuk, T., Mascher, P.
Published in Journal of applied physics (15.01.2008)

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Structure and luminescence of rare earth-doped silicon oxides studied through their X-ray absorption near edge structure and X-ray excited optical luminescence

Structure and luminescence of rare earth-doped silicon oxides studied through their X-ray absorption near edge structure and X-ray excited optical luminescence

by Roschuk, T., Wilson, P. R. J., Li, J., Zalloum, O. H. Y., Wojcik, J., Mascher, P.
Published in physica status solidi (b) (01.02.2010)

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Inside Back Cover (Phys. Status Solidi B 2/2010)

Inside Back Cover (Phys. Status Solidi B 2/2010)

by Roschuk, T., Wilson, P. R. J., Li, J., Zalloum, O. H. Y., Wojcik, J., Mascher, P.
Published in physica status solidi (b) (01.02.2010)

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Structure and luminescence of rare earth-doped silicon oxides studied through their X-ray absorption near edge structure and X-ray excited optical luminescence: Structure and luminescence of rare earth-doped silicon oxides

Structure and luminescence of rare earth-doped silicon oxides studied through their X-ray absorption near edge structure and X-ray excited optical luminescence: Structure and luminescence of rare earth-doped silicon oxides

by Roschuk, T., Wilson, P. R. J., Li, J., Zalloum, O. H. Y., Wojcik, J., Mascher, P.
Published in physica status solidi (b) (01.02.2010)

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Inside Back Cover (Phys. Status Solidi B 2/2010)

Inside Back Cover (Phys. Status Solidi B 2/2010)

by Roschuk, T., Wilson, P. R. J., Li, J., Zalloum, O. H. Y., Wojcik, J., Mascher, P.
Published in physica status solidi (b) (01.02.2010)

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Journal Article

Inside Back Cover (Phys. Status Solidi B 2/2010)

Inside Back Cover (Phys. Status Solidi B 2/2010)

by Roschuk, T., Wilson, P. R. J., Li, J., Zalloum, O. H. Y., Wojcik, J., Mascher, P.
Published in physica status solidi (b) (01.02.2010)

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Photoluminescence and positron annihilation spectroscopy of MeV Si + ion-irradiated Si y O 1 − y : Er ( y ≈ 1 / 3 ) thin films

Photoluminescence and positron annihilation spectroscopy of MeV Si + ion-irradiated Si y O 1 − y : Er ( y ≈ 1 / 3 ) thin films

by Blakie, D. E., Zalloum, O. H. Y., Wojcik, J., Irving, E. A., Knights, A. P., Mascher, P., Simpson, P. J.
Published in Journal of applied physics (12.03.2009)

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$Photoluminescence and positron annihilation spectroscopy of MeV Si{sup +} ion-irradiated Si{sub y}O{sub 1-y}:Er (y{approx_equal}1/3) thin films$

Photoluminescence and positron annihilation spectroscopy of MeV Si{sup +} ion-irradiated Si{sub y}O{sub 1-y}:Er (y{approx_equal}1/3) thin films

by Blakie, D. E., Zalloum, O. H. Y., Wojcik, J., Irving, E. A., Knights, A. P., Mascher, P., Simpson, P. J.
Published in Journal of applied physics (01.03.2009)

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Light Emission From Hydrogenated and Unhydrogenated Si-Nanocrystal/Si Dioxide Composites Based on PECVD-Grown Si-Rich Si Oxide Films

Light Emission From Hydrogenated and Unhydrogenated Si-Nanocrystal/Si Dioxide Composites Based on PECVD-Grown Si-Rich Si Oxide Films

by Comedi, D., Zalloum, O.H.Y., Wojcik, J., Mascher, P.
Published in IEEE journal of selected topics in quantum electronics (01.11.2006)

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Photoluminescence and positron annihilation spectroscopy of MeV Si+ ion-irradiated SiyO1−y:Er (y≈1/3) thin films

Photoluminescence and positron annihilation spectroscopy of MeV Si+ ion-irradiated SiyO1−y:Er (y≈1/3) thin films

by Blakie, D. E., Zalloum, O. H. Y., Wojcik, J., Irving, E. A., Knights, A. P., Mascher, P., Simpson, P. J.
Published in Journal of applied physics (01.03.2009)

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Structure and luminescence of rare Editor's Ch earth-doped silicon oxides studied through their X-ray absorption near edge structure and X-ray excited optical luminescence

Structure and luminescence of rare Editor's Ch earth-doped silicon oxides studied through their X-ray absorption near edge structure and X-ray excited optical luminescence

by ROSCHUK, T, WILSON, P. R. J, LI, J, ZALLOUM, O. H. Y, WOJCIK, J, MASCHER, P
Published in Physica status solidi. B. Basic research (2010)

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Formation and oxidation of Si nanoclusters in Er-doped Si-rich SiOx

Formation and oxidation of Si nanoclusters in Er-doped Si-rich SiOx

by Pi, X. D., Zalloum, O. H. Y., Wojcik, J., Knights, A. P., Mascher, P., Todd, A. D. W., Simpson, P. J.
Published in Journal of applied physics (01.05.2005)

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Formation and oxidation of Si nanoclusters in Er-doped Si-rich Si O x

Formation and oxidation of Si nanoclusters in Er-doped Si-rich Si O x

by Pi, X. D., Zalloum, O. H. Y., Wojcik, J., Knights, A. P., Mascher, P., Todd, A. D. W., Simpson, P. J.
Published in Journal of applied physics (27.04.2005)

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Design of a modern optical fibre spectral transmissometer and a 120° scattering meter

Design of a modern optical fibre spectral transmissometer and a 120° scattering meter

by ZALLOUM, O. H. Y
Published in Journal of optics (1998)

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Photoluminescence Study of an Er-Doped Si-Rich SiO[sub x] Film

Photoluminescence Study of an Er-Doped Si-Rich SiO[sub x] Film

by Heng, C. L., Zalloum, O. H. Y., Roschuk, T., Blakie, D., Wojcik, J., Mascher, P.
Published in Electrochemical and solid-state letters (2007)

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Electrical conduction of silicon oxide containing silicon quantum dots

Electrical conduction of silicon oxide containing silicon quantum dots

by Pi, X. D, Zalloum, O. H. Y, Knights, A. P, Mascher, P, Simpson, P. J
Year of Publication 02.04.2006

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