Low Energy Proton Irradiation Effects on Commercial Enhancement Mode GaN HEMTs
Xin Wan, Baker, Oliver K., McCurdy, Michael W., En Xia Zhang, Zafrani, Max, Wainwright, Simon P., Jun Xu, Han Liang Bo, Reed, Robert A., Fleetwood, Daniel M., Ma, T. P.
Published in IEEE transactions on nuclear science (01.01.2017)
Published in IEEE transactions on nuclear science (01.01.2017)
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Worst-Case Test Conditions of SEGR for Power DMOSFETs
Liu, Sandra, Titus, Jeffrey L., Zafrani, Max, Cao, Huy, Carrier, Douglas, Sherman, Phillip
Published in IEEE transactions on nuclear science (01.02.2010)
Published in IEEE transactions on nuclear science (01.02.2010)
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Influence of Beam Conditions and Energy for SEE Testing
Ferlet-Cavrois, Veronique, Schwank, James R., Liu, Sandra, Muschitiello, Michele, Beutier, Thierry, Javanainen, Arto, Hedlund, Alex, Poivey, Christian, Mohammadzadeh, Ali, Harboe-Sorensen, Reno, Santin, Giovanni, Nickson, Bob, Menicucci, Alessandra, Binois, Christian, Peyre, Daniel, Hoeffgen, Stefan Klaus, Metzger, Stefan, Schardt, Dieter, Kettunen, Heikki, Virtanen, Ari, Berger, Guy, Piquet, Bruno, Foy, Jean-Claude, Zafrani, Max, Truscott, Pete, Poizat, Marc, Bezerra, Francoise
Published in IEEE transactions on nuclear science (01.08.2012)
Published in IEEE transactions on nuclear science (01.08.2012)
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Effects of Ion Species on SEB Failure Voltage of Power DMOSFET
Liu, S., Lauenstein, Jean-Marie, Ferlet-Cavrois, V., Marec, R., Hernandez, F., Scheick, L., Bezerra, F., Muschitiello, M., Poivey, C., Sukhaseum, N., Coquelet, L., Cao, H., Carrier, D., Brisebois, M. A., Mangeret, R., Ecoffet, R., LaBel, K., Zafrani, M., Sherman, P.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Evaluation on Protective Single Event Burnout Test Method for Power DMOSFETs
Liu, Sandra, Marec, Ronan, Sherman, Phillip, Titus, Jeffrey L., Bezerra, Francoise, Ferlet-Cavois, Véronique, Marin, Marc, Sukhaseum, Nicolas, Widmer, Fabien, Muschitiello, Michele, Gouyet, Lionel, Ecoffet, Robert, Zafrani, Max
Published in IEEE transactions on nuclear science (01.08.2012)
Published in IEEE transactions on nuclear science (01.08.2012)
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Effects of Ion Atomic Number on Single-Event Gate Rupture (SEGR) Susceptibility of Power MOSFETs
Lauenstein, J.-M, Goldsman, N., Liu, S., Titus, J. L., Ladbury, R. L., Kim, H. S., Phan, A. M., LaBel, K. A., Zafrani, M., Sherman, P.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Recommended Test Conditions for SEB Evaluation of Planar Power DMOSFETs
Liu, S., Titus, J.L., DiCienzo, C., Huy Cao, Zafrani, M., Boden, M., Berberian, R.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Analysis of Commercial Trench Power MOSFETs' Responses to ^ Irradiation
Liu, S., DiCienzo, C., Bliss, M., Zafrani, M., Boden, M., Titus, J.L.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
VOLTAGE DETECTION CIRCUIT
Marini Anthony G.P, Wainwright Simon P, Zafrani Max, Larrauri James L
Year of Publication 15.06.2017
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Year of Publication 15.06.2017
Patent
A VOLTAGE DETECTION CIRCUIT
ZAFRANI, Max, MARINI, Anthony G.P, WAINWRIGHT, Simon P, LARRAURI, James L
Year of Publication 15.06.2017
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Year of Publication 15.06.2017
Patent
Evaluation on protective single event burnout test method for power DMOSFETs
Liu, S., Marec, R., Sherman, P., Titus, J. L., Bezerra, F., Ferlet-Cavrois, V., Marin, M., Sukhaseum, N., Widmer, F., Muschitiello, M., Gouyet, L., Ecoffet, R., Zafrani, M.
Published in 2011 12th European Conference on Radiation and Its Effects on Components and Systems (01.09.2011)
Published in 2011 12th European Conference on Radiation and Its Effects on Components and Systems (01.09.2011)
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Conference Proceeding
Effects of Ion Atomic Number on Single-Event Gate Rupture (SEGR) Susceptibility of Power MOSFETs
Lauenstein, Jean-Marie, Goldsman, Neil, Liu, Sandra, Titus, Jeffrey L, Ladbury, Raymond L, Kim, Hak S, Phan, Anthony M, LaBel, Kenneth A, Zafrani, Max, Sherman, Phillip
Published in NASA Center for AeroSpace Information (CASI). Misc. Resources (01.01.2012)
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Published in NASA Center for AeroSpace Information (CASI). Misc. Resources (01.01.2012)
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