Read disturb on flash memories: Study on temperature annealing effect
Cola, L., De Tomasi, M., Enrici Vaion, R., Mervic, A., Zabberoni, P.
Published in Microelectronics and reliability (01.09.2012)
Published in Microelectronics and reliability (01.09.2012)
Get full text
Journal Article
Conference Proceeding
Advanced salicided 4 Mbit flash memory array with borderless contacts
Peschiaroli, D., Clementi, C., Garofalo, P., Ghezzi, P., Ghilardi, T., Lista, V., Marangon, T., Mastracchio, G., Maurelli, A., Niel, S., Palumbo, E., Pipia, F., Soleri, S., Zabberoni, P.
Published in Microelectronic engineering (01.03.2001)
Published in Microelectronic engineering (01.03.2001)
Get full text
Journal Article
Conference Proceeding
Robust automotive products in advanced CMOS nodes
Huard, V., Mhira, S., De Tomasi, M., Trabace, E., Vaion, R. Enrici, Zabberoni, P.
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Get full text
Conference Proceeding
New methodology for drift analysis on reliability trial
De Tomasi, M., Vaion, R. Enrici, Cola, L., Zabberoni, P., Mervic, A.
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Get full text
Conference Proceeding
Drain stress influence on read disturb defectivity
De Tomasi, M., Vaion, R. E., Cola, L., Zabberoni, P., Mervic, A.
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
Get full text
Conference Proceeding
Flash-based programmable nonlinear capacitor for switched-capacitor implementations of neural networks
Kramer, A., Sabatini, M., Canegallo, R., Chinosi, M., Rolandi, P.L., Zabberoni, P.
Published in Proceedings of 1994 IEEE International Electron Devices Meeting (1994)
Published in Proceedings of 1994 IEEE International Electron Devices Meeting (1994)
Get full text
Conference Proceeding
Journal Article
Thin copper wire under extreme HTSL stress duration: Crack failure mechanism characterization
Vaion, R. Enrici, Mancaleoni, A., Cola, L., De Tornasi, M., Zabberoni, P.
Published in 2016 IEEE 18th Electronics Packaging Technology Conference (EPTC) (01.11.2016)
Published in 2016 IEEE 18th Electronics Packaging Technology Conference (EPTC) (01.11.2016)
Get full text
Conference Proceeding
A Triple-well Architecture for Low-voltage Operation in Submicron CMOS Devices
Auricchio, C., Bez, R., Losavio, A., Maurelli, A., Sala, C., Zabberoni, P.
Published in ESSDERC '96: Proceedings of the 26th European Solid State Device Research Conference (01.09.1996)
Get full text
Published in ESSDERC '96: Proceedings of the 26th European Solid State Device Research Conference (01.09.1996)
Conference Proceeding