CNN-LRP: Understanding Convolutional Neural Networks Performance for Target Recognition in SAR Images
Zang, Bo, Ding, Linlin, Feng, Zhenpeng, Zhu, Mingzhe, Lei, Tao, Xing, Mengdao, Zhou, Xianda
Published in Sensors (Basel, Switzerland) (01.07.2021)
Published in Sensors (Basel, Switzerland) (01.07.2021)
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Journal Article
Mechanisms and high-value applications of phthalate isomers degradation pathways in bacteria
Lequan, Qiu, Yanan, Fu, Xianda, Zhou, Mengyuan, Bao, Chenyu, Li, Shijin, Wu
Published in World journal of microbiology & biotechnology (01.08.2024)
Published in World journal of microbiology & biotechnology (01.08.2024)
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Journal Article
C-RISE: A Post-Hoc Interpretation Method of Black-Box Models for SAR ATR
Zhu, Mingzhe, Cheng, Jie, Lei, Tao, Feng, Zhenpeng, Zhou, Xianda, Liu, Yuanjing, Chen, Zhihan
Published in Remote sensing (Basel, Switzerland) (01.06.2023)
Published in Remote sensing (Basel, Switzerland) (01.06.2023)
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Journal Article
Interpretation of Latent Codes in InfoGAN with SAR Images
Feng, Zhenpeng, Daković, Miloš, Ji, Hongbing, Zhou, Xianda, Zhu, Mingzhe, Cui, Xiyang, Stanković, Ljubiša
Published in Remote sensing (Basel, Switzerland) (01.03.2023)
Published in Remote sensing (Basel, Switzerland) (01.03.2023)
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Journal Article
Application of S-Transform Random Consistency in Inverse Synthetic Aperture Imaging Laser Radar Imaging
Zang, Bo, Zhu, Mingzhe, Zhou, Xianda, Zhong, Lu, Tian, Zijiao
Published in Applied sciences (01.06.2019)
Published in Applied sciences (01.06.2019)
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Journal Article
Hot Carrier Injection Effects in the Ultrashallow Body SONOS Gate Power MOSFET
Xianda Zhou, Hao Feng, Sin, J. K. O.
Published in IEEE transactions on electron devices (01.06.2013)
Published in IEEE transactions on electron devices (01.06.2013)
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Journal Article
UIS Analysis and Characterization of the SONOS Gate Power MOSFET
Xianda Zhou, Ng, J. C. W., Sin, J. K. O.
Published in IEEE transactions on electron devices (01.02.2012)
Published in IEEE transactions on electron devices (01.02.2012)
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Journal Article
Planar SONOS gate power MOSFET with an ultra-shallow body region
Xianda Zhou, Hao Feng, Sin, J. K. O.
Published in 2012 24th International Symposium on Power Semiconductor Devices and ICs (01.06.2012)
Published in 2012 24th International Symposium on Power Semiconductor Devices and ICs (01.06.2012)
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Conference Proceeding
Fabrication and Characterization of High-Voltage NiO/β-Ga2O3 Heterojunction Power Diodes
Luo, Haoxun, Zhou, Xianda, Chen, Zimin, Pei, Yanli, Lu, Xing, Wang, Gang
Published in IEEE transactions on electron devices (01.08.2021)
Published in IEEE transactions on electron devices (01.08.2021)
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Journal Article
Avalanche capability degradation of the parallel-connected SiC MOSFETs
Mao, Hua, Ran, Li, Chen, Haoyu, Zhou, Xianda, Jiang, Huaping
Published in Microelectronics and reliability (01.03.2023)
Published in Microelectronics and reliability (01.03.2023)
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Journal Article
A probe-feature for specific emitter identification using axiom-based grad-CAM
Zhu, Mingzhe, Feng, Zhenpeng, Stanković, Ljubiša, Ding, Linlin, Fan, Jingyuan, Zhou, Xianda
Published in Signal processing (01.12.2022)
Published in Signal processing (01.12.2022)
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Journal Article
Simulation Study of a Power MOSFET With Built-in Channel Diode for Enhanced Reverse Recovery Performance
Zhang, Meng, Wei, Jin, Zhou, Xianda, Jiang, Huaping, Li, Baikui, Chen, Kevin J.
Published in IEEE electron device letters (01.01.2019)
Published in IEEE electron device letters (01.01.2019)
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Journal Article
High Baliga's Figure of Merit Amorphous InGaZnO Power Transistor with Ultra-Thin Indium Zinc Oxide Buried Layer
Huang, Chenyang, Huang, Xiaoming, Yao, Jiafei, Zhang, Jun, Li, Man, Liu, Jianhua, Zhang, Maolin, Zhou, Xianda, Guo, Yufeng
Published in IEEE electron device letters (01.05.2023)
Published in IEEE electron device letters (01.05.2023)
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Journal Article