300 MM Wafer Laser Anneal Process Development for Applications of Multiple Process Condition in Different Zones on Single Wafer
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Published in 2022 China Semiconductor Technology International Conference (CSTIC) (20.06.2022)
Published in 2022 China Semiconductor Technology International Conference (CSTIC) (20.06.2022)
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Conference Proceeding
Evaluation of Capacitive Humidity Sensor with Polyimide as Sensing Material
Kang, Xiaoxu, Zhong, Xiaolan, Chu, Zhenghui, Zhang, Min, Zhou, Xiaoqiang, Qi, Jiming, Jia, Qi, Zhong, Weifa, Liang, Huajian, Kang, Xiaozhi, Sun, Qingqing
Published in 2022 China Semiconductor Technology International Conference (CSTIC) (20.06.2022)
Published in 2022 China Semiconductor Technology International Conference (CSTIC) (20.06.2022)
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Conference Proceeding
14Nm Fin Sadp Patterning Processes and Integration
Yi, Chunyan, Li, Ming, Lou, Yongjian, Wang, Weijun, Liu, Zhunhua, Zhou, Xiaoqiang, Xu, Wen, Zhang, Ying
Published in 2020 China Semiconductor Technology International Conference (CSTIC) (26.06.2020)
Published in 2020 China Semiconductor Technology International Conference (CSTIC) (26.06.2020)
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Conference Proceeding
Partial cooperative spectrum sensing schedule in cognitive network
Xu, FangMin, Zheng, XuFeng, Li, XiaoQiang, Zhou, Zheng
Published in Science China. Information sciences (01.12.2009)
Published in Science China. Information sciences (01.12.2009)
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Journal Article