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Defect detection based on tunable wavelength laser source induced second harmonics
by
HUANG CHONGJI
,
ZHAO WEIWEI
,
ZHOU PIAOXI
Year of Publication
09.02.2024
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Method and device for measuring semiconductor multilayer structure based on second harmonic
by
HUANG CHONGJI
,
ZHAO WEIWEI
,
ZHOU PIAOXI
Year of Publication
29.07.2022
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basic electric elements
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electric solid state devices not otherwise provided for
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