Failure Analysis and Improvement of Superjunction MOSFET under UIS Stress Condition
Ren, Min, Ma, Yining, Zhong, Shengrong, Li, Wei, Wu, Songrong, Li, Zehong, Gao, Wei, Zhang, Bo
Published in 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2019)
Published in 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2019)
Get full text
Conference Proceeding
Failure Analysis and Improvement of the Body Diode in Superjunction Power MOSFET
Ren, Min, Yang, Mengqi, Zhong, Shengrong, Xie, Chi, Li, Zehong, Gao, Wei, Zhang, Jinping, Zhang, Bo
Published in 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2018)
Published in 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2018)
Get full text
Conference Proceeding