A holistic methodology to address leading edge FPGA manufacturing challenge
Chen, Cinti, Zhao, Joe W, Chang, Ellis, Xiao-Yu Li
Published in 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (01.11.2010)
Published in 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (01.11.2010)
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Conference Proceeding
Achieving Fast Yield Improvement by Defect to Bit Failure Overlay Method
Chen, Cinti, Zhao, Joe W., Qian, Gang, Fan, Jenny, Li, Xiao-Yu
Published in ECS transactions (01.01.2010)
Published in ECS transactions (01.01.2010)
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Journal Article
Method of metal pattern inspection verification
Zheng, Yongjun, Mark, David, Zhao, Joe W, Pagaduan, Felino Encarnacion
Year of Publication 16.08.2011
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Year of Publication 16.08.2011
Patent