Search Results - "ZABERCHIK, MORAN" :: K.UTB vyhledávací portál

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Selection of regions of interest for measurement of misregistration and amelioration thereof

by Zaberchik, Moran, Volkovich, Roie
Year of Publication 02.05.2023

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Patent

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SELECTION OF REGIONS OF INTEREST FOR MEASUREMENT OF MISREGISTRATION AND AMELIORATION THEREOF

by Zaberchik, Moran, Volkovich, Roie
Year of Publication 25.11.2021

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Patent

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SELECTION OF REGIONS OF INTEREST FOR MEASUREMENT OF MISREGISTRATION AND AMELIORATION THEREOF

by VOLKOVICH, Roie, ZABERCHIK, Moran
Year of Publication 30.12.2020

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Patent

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Overlay measurement using phase and amplitude modeling

by Gutman, Nadav, Zaberchik, Moran, Amit, Eran
Year of Publication 14.04.2020

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Patent

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OVERLAY MEASUREMENT USING PHASE AND AMPLITUDE MODELING

by GUTMAN, Nadav, ZABERCHIK, Moran, AMIT, Eran
Year of Publication 12.12.2019

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Patent

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Overlay Measurement Using Phase and Amplitude Modeling

by Gutman, Nadav, Zaberchik, Moran, Amit, Eran
Year of Publication 12.12.2019

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Patent

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Selection of regions of interest for measurement of misregistration and amelioration thereof

by VOLKOVICH, ROIE, ZABERCHIK, MORAN
Year of Publication 16.04.2021

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Patent

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METHOD FOR MEASURING AND CORRECTING MISREGISTRATION BETWEEN LAYERS IN A SEMICONDUCTOR DEVICE, AND MISREGISTRATION TARGETS USEFUL THEREIN

by MILO, Renan, FELER, Yoel, VOLKOVICH, Roie, ZABERCHIK, Moran, IZRAELI, David, YERUSHALMI, Liran
Year of Publication 15.02.2023

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Patent

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METHOD FOR MEASURING AND CORRECTING MISREGISTRATION BETWEEN LAYERS IN A SEMICONDUCTOR DEVICE, AND MISREGISTRATION TARGETS USEFUL THEREIN

by Milo, Renan, Zaberchik, Moran, Feler, Yoel, Yerushalmi, Liran, Volkovich, Roie, Izraeli, David
Year of Publication 23.06.2022

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Patent

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Method for measuring and correcting misregistration between layers in a semiconductor device, and misregistration targets useful therein

by Milo, Renan, Zaberchik, Moran, Feler, Yoel, Yerushalmi, Liran, Volkovich, Roie, Izraeli, David
Year of Publication 12.04.2022

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Patent

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METHOD FOR MEASURING AND CORRECTING MISREGISTRATION BETWEEN LAYERS IN A SEMICONDUCTOR DEVICE, AND MISREGISTRATION TARGETS USEFUL THEREIN

by MILO, Renan, FELER, Yoel, VOLKOVICH, Roie, ZABERCHIK, Moran, IZRAELI, David, YERUSHALMI, Liran
Year of Publication 09.02.2022

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Patent

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METHOD FOR MEASURING AND CORRECTING MISREGISTRATION BETWEEN LAYERS IN A SEMICONDUCTOR DEVICE, AND MISREGISTRATION TARGETS USEFUL THEREIN

by MILO, Renan, FELER, Yoel, VOLKOVICH, Roie, ZABERCHIK, Moran, IZRAELI, David, YERUSHALMI, Liran
Year of Publication 01.10.2020

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Patent

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METHOD FOR MEASURING AND CORRECTING MISREGISTRATION BETWEEN LAYERS IN A SEMICONDUCTOR DEVICE, AND MISREGISTRATION TARGETS USEFUL THEREIN

by Milo, Renan, Zaberchik, Moran, Feler, Yoel, Yerushalmi, Liran, Volkovich, Roie, Izraeli, David
Year of Publication 01.10.2020

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Patent

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Method for measuring and correcting misregistration between layers in a semiconductor device, and misregistration targets useful therein

by VOLKOVICH, ROIE, ZABERCHIK, MORAN, YERUSHALMI, LIRAN, MILO, RENAN, IZRAELI, DAVID, FELER, YOEL
Year of Publication 21.03.2024

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Patent

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Method for measuring and correcting misregistration between layers in semiconductor device, and misregistration targets useful therein

by YERUSHALMI LIRAN, ZABERCHIK MORAN, VOLKOVICH ROIE, FELER YOEL, IZRAELI DAVID, MILO RENAN
Year of Publication 11.01.2022

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Patent

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Method for measuring and correcting misregistration between layers in a semiconductor device, and misregistration targets useful therein

by VOLKOVICH, ROIE, ZABERCHIK, MORAN, YERUSHALMI, LIRAN, MILO, RENAN, IZRAELI, DAVID, FELER, YOEL
Year of Publication 01.02.2021

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Patent

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Possible evidence for two-gap superconductivity in TiSe_2Cu_x

by Zaberchik, Moran, Chashka, Khanan, Patlgan, Larisa, Maniv, Ariel, Baines, Chris, King, Philip, Kanigel, Amit
Year of Publication 08.06.2010

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Journal Article

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Possible evidence for two-gap superconductivity in TiSe_2Cu_x

by Moran Zaberchik, Chashka, Khanan, Patlgan, Larisa, Maniv, Ariel, Baines, Chris, King, Philip, Kanigel, Amit
Published in arXiv.org (08.06.2010)

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Paper

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