Fractal Dimension of Thin-film Surfaces Obtained by Fourier Spectral Analysis
Get full text
Journal Article
Conference Proceeding
Investigation of the surface topography for the characterization of microstructures of amorphous SiNx-coatings
Zahn, W., Wuttke, W., Z sch, A.
Published in Fresenius' Journal of Analytical Chemistry (01.01.1995)
Published in Fresenius' Journal of Analytical Chemistry (01.01.1995)
Get full text
Journal Article
Buchbesprechungen
Hs, K., Autrum, H., Hottinger, L., Fabian, P., Moesta, H., Sch z, A., Jaenicke, L., Sch gerl, K., Runge, M.
Published in Die Naturwissenschaften (01.09.1983)
Published in Die Naturwissenschaften (01.09.1983)
Get full text
Journal Article