A 1/2.7 inch Low-Noise CMOS Image Sensor for Full HD Camcorders
Takahashi, Hidekazu, Noda, Tomoyuki, Matsuda, Takashi, Watanabe, Takanori, Shinohara, Mahito, Endo, Toshiaki, Takimoto, Shunsuke, Mishima, Ryuuichi, Nishimura, Shigeru, Sakurai, Katuhito, Yuzurihara, Hiroshi, Inoue, Shunsuke
Published in 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (01.02.2007)
Published in 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (01.02.2007)
Get full text
Conference Proceeding
High-definition and high-sensitivity CMOS image sensor with all-pixel image plane phase-difference detection autofocus
Kobayashi, Masahiro, Ohmura, Masanobu, Takahashi, Hidekazu, Shirai, Takahiro, Sakurai, Katsuhito, Ichikawa, Takeshi, Yuzurihara, Hiroshi, Inoue, Shunsuke
Published in Japanese Journal of Applied Physics (01.10.2018)
Published in Japanese Journal of Applied Physics (01.10.2018)
Get full text
Journal Article
A 1.8e ^} Temporal Noise Over 110-dB-Dynamic Range 3.4 \mu \text Pixel Pitch Global-Shutter CMOS Image Sensor With Dual-Gain Amplifiers SS-ADC, Light Guide Structure, and Multiple-Accumulation Shutter
Kobayashi, Masahiro, Onuki, Yusuke, Kawabata, Kazunari, Sekine, Hiroshi, Tsuboi, Toshiki, Muto, Takashi, Akiyama, Takeshi, Matsuno, Yasushi, Takahashi, Hidekazu, Koizumi, Toru, Sakurai, Katsuhito, Yuzurihara, Hiroshi, Inoue, Shunsuke, Ichikawa, Takeshi
Published in IEEE journal of solid-state circuits (01.01.2018)
Published in IEEE journal of solid-state circuits (01.01.2018)
Get full text
Journal Article
4.5 A 1.8erms− temporal noise over 110dB dynamic range 3.4µm pixel pitch global shutter CMOS image sensor with dual-gain amplifiers, SS-ADC and multiple-accumulation shutter
Kobayashi, Masahiro, Onuki, Yusuke, Kawabata, Kazunari, Sekine, Hiroshi, Tsuboi, Toshiki, Matsuno, Yasushi, Takahashi, Hidekazu, Koizumi, Toru, Sakurai, Katsuhito, Yuzurihara, Hiroshi, Inoue, Shunsuke, Ichikawa, Takeshi
Published in 2017 IEEE International Solid-State Circuits Conference (ISSCC) (01.02.2017)
Published in 2017 IEEE International Solid-State Circuits Conference (ISSCC) (01.02.2017)
Get full text
Conference Proceeding
6.4 An APS-H-Size 250Mpixel CMOS image sensor using column single-slope ADCs with dual-gain amplifiers
Totsuka, Hirofumi, Tsuboi, Toshiki, Muto, Takashi, Yoshida, Daisuke, Matsuno, Yasushi, Ohmura, Masanobu, Takahashi, Hidekazu, Sakurai, Katsuhito, Ichikawa, Takeshi, Yuzurihara, Hiroshi, Inoue, Shunsuke
Published in 2016 IEEE International Solid-State Circuits Conference (ISSCC) (01.01.2016)
Published in 2016 IEEE International Solid-State Circuits Conference (ISSCC) (01.01.2016)
Get full text
Conference Proceeding
A 3.9-μm pixel pitch VGA format 10-b digital output CMOS image sensor with 1.5 transistor/pixel
TAKAHASHI, Hidekazu, KINOSHITA, Masakuni, MORITA, Kazumichi, SHIRAI, Takahiro, SATO, Toshiaki, KIMURA, Takayuki, YUZURIHARA, Hiroshi, INOUE, Shunsuke, MATSUMOTO, Shigeyuki
Published in IEEE journal of solid-state circuits (01.12.2004)
Published in IEEE journal of solid-state circuits (01.12.2004)
Get full text
Conference Proceeding
Journal Article
A 1/2.7-in 2.96 MPixel CMOS Image Sensor With Double CDS Architecture for Full High-Definition Camcorders
Takahashi, H., Noda, T., Matsuda, T., Watanabe, T., Shinohara, M., Endo, T., Takimoto, S., Mishima, R., Nishimura, S., Sakurai, K., Yuzurihara, H., Inoue, S.
Published in IEEE journal of solid-state circuits (01.12.2007)
Published in IEEE journal of solid-state circuits (01.12.2007)
Get full text
Journal Article
Conference Proceeding