by Nhat Nguyen Minh, McIlvanna, Stephen, Sun, Yuzhu, Jin, Yan, Mien Van
Published in arXiv.org (17.06.2024)

by SUN YUZHU
Year of Publication 31.05.2019

by Sun, Yuzhu, Mien Van, McIlvanna, Stephen, McLoone, Sean, Ceglarek, Dariusz
Published in arXiv.org (09.08.2022)

by Sun, Yuzhu, Mien Van, McIlvanna, Stephen, McLoone, Sean, Ceglarek, Dariusz
Published in arXiv.org (09.08.2022)

by Kabirat Olayemi, Mien Van, McLoone, Sean, Sun, Yuzhu, Close, Jack, Nguyen, Minh Nhat, McIlvanna, Stephen
Published in arXiv.org (22.03.2024)

by Sun, Yuzhu, Mien Van, McIlvanna, Stephen, Nguyen, Minh Nhat, Kabirat Olayemi, Close, Jack, McLoone, Seán
Published in arXiv.org (19.03.2024)

by Fang, Jiemin, Sun, Yuzhu, Peng, Kangjian, Zhang, Qian, Li, Yuan, Liu, Wenyu, Wang, Xinggang
Year of Publication 08.01.2020

by SUN YUZHU
Year of Publication 30.11.2018

by SUN YUZHU
Year of Publication 30.11.2018

by SUN YUZHU
Year of Publication 30.11.2018

by SUN YUZHU
Year of Publication 30.11.2018

by SUN YUZHU
Year of Publication 30.11.2018

by SUN YUZHU
Year of Publication 30.11.2018

by SUN YUZHU
Year of Publication 23.10.2018

by SUN YUZHU
Year of Publication 23.10.2018

by SUN YUZHU
Year of Publication 23.10.2018

by SUN YUZHU
Year of Publication 23.10.2018

by SUN YUZHU
Year of Publication 23.10.2018

by SUN YUZHU
Year of Publication 23.10.2018

by Sun, Yuzhu, Lu, Daisy, Mark, Dave, Di, Chennian, Fan, Jenny, Leslie, Neel
Published in 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2019)