Investigation on hot carrier reliability of Gate-All-Around Twin Si Nanowire Field Effect Transistor
Yun Young Yeoh, Sung Dae Suk, Ming Li, Kyoung Hwan Yeo, Dong-Won Kim, Gyoyoung Jin, Kyoungsuk Oh
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
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Conference Proceeding
Twin silicon nanowire FET (TSNWFET) On SOI with 8 nm silicon nanowires and 25 nm surrounding TiN gate
Dong-Won Kim, Ming Li, Kyoung Hwan Yeo, Yun Young Yeoh, Sung Dae Suk, Keun Hwi Cho, Kyungseok Oh, Won-Seong Lee
Published in 2008 IEEE International SOI Conference (01.10.2008)
Published in 2008 IEEE International SOI Conference (01.10.2008)
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Conference Proceeding
Characterization and Modeling of 1/ f Noise in Si-nanowire FETs: Effects of Cylindrical Geometry and Different Processing of Oxides
Rock-Hyun Baek, Chang-Ki Baek, Hyun-Sik Choi, Jeong-Soo Lee, Yun Young Yeoh, Kyoung Hwan Yeo, Dong-Won Kim, Kinam Kim, Kim, D M, Yoon-Ha Jeong
Published in IEEE transactions on nanotechnology (01.05.2011)
Published in IEEE transactions on nanotechnology (01.05.2011)
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Journal Article
High-Performance Twin Silicon Nanowire MOSFET (TSNWFET) on Bulk Si Wafer
Suk, Sung Dae, Yeo, Kyoung Hwan, Cho, Keun Hwi, Li, Ming, Yeoh, Yun Young, Lee, Sung-Young, Kim, Sung Min, Yoon, Eun Jung, Kim, Min Sang, Oh, Chang Woo, Kim, Sung Hwan, Kim, Dong-Won, Park, Donggun
Published in IEEE transactions on nanotechnology (01.03.2008)
Published in IEEE transactions on nanotechnology (01.03.2008)
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Journal Article
Investigation of nanowire size dependency on TSNWFET
Sung Dae Suk, Ming Li, Yun Young Yeoh, Kyoung Hwan Yeo, Keun Hwi Cho, In Kyung Ku, Hong Cho, WonJun Jang, Dong-Won Kim, Donggun Park, Won-Seong Lee
Published in 2007 IEEE International Electron Devices Meeting (01.12.2007)
Published in 2007 IEEE International Electron Devices Meeting (01.12.2007)
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Conference Proceeding
C- V Characteristics in Undoped Gate-All-Around Nanowire FET Array
Rock-Hyun Baek, Chang-Ki Baek, Sang-Hyun Lee, Sung Dae Suk, Ming Li, Yun Young Yeoh, Kyoung Hwan Yeo, Dong-Won Kim, Jeong-Soo Lee, Kim, D M, Yoon-Ha Jeong
Published in IEEE electron device letters (01.02.2011)
Published in IEEE electron device letters (01.02.2011)
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Journal Article
Characteristics of the Series Resistance Extracted From Si Nanowire FETs Using the Y -Function Technique
Rock-Hyun Baek, Chang-Ki Baek, Sung-Woo Jung, Yun Young Yeoh, Dong-Won Kim, Jeong-Soo Lee, Kim, D.M., Yoon-Ha Jeong
Published in IEEE transactions on nanotechnology (01.03.2010)
Published in IEEE transactions on nanotechnology (01.03.2010)
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Journal Article
Temperature-Dependent Characteristics of Cylindrical Gate-All-Around Twin Silicon Nanowire MOSFETs (TSNWFETs)
Cho, Keun Hwi, Suk, Sung Dae, Yeoh, Yun Young, Li, Ming, Yeo, Kyoung Hwan, Kim, Dong-Won, Park, Donggun, Lee, Won-Seong, Jung, Young Chai, Hong, Byung Hak, Hwang, Sung Woo
Published in IEEE electron device letters (01.12.2007)
Published in IEEE electron device letters (01.12.2007)
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Journal Article
Sub-10 nm gate-all-around CMOS nanowire transistors on bulk Si substrate
Ming Li, Kyoung Hwan Yeo, Sung Dae Suk, Yun Young Yeoh, Dong-Won Kim, Tae Young Chung, Kyung Seok Oh, Won-Seong Lee
Published in 2009 Symposium on VLSI Technology (01.06.2009)
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Published in 2009 Symposium on VLSI Technology (01.06.2009)
Conference Proceeding
Comparison of Series Resistance and Mobility Degradation Extracted from n- and p-Type Si-Nanowire Field Effect Transistors Using the $Y$-Function Technique
Baek, Rock-Hyun, Baek, Chang-Ki, Jung, Sung-Woo, Yeoh, Yun Young, Kim, Dong-Won, Lee, Jeong-Soo, Kim, Dae M, Jeong, Yoon-Ha
Published in Japanese Journal of Applied Physics (01.04.2010)
Published in Japanese Journal of Applied Physics (01.04.2010)
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Journal Article
Characteristics of sub 5nm tri-gate nanowire MOSFETs with single and poly Si channels in SOI structure
Sung Dae Suk, Ming Li, Yun Young Yeoh, Kyoung Hwan Yeo, Jae Kyu Ha, Hyunseok Lim, HyunWoo Park, Dong-Won Kim, TaeYoung Chung, Kyung Seok Oh, Won-Seong Lee
Published in 2009 Symposium on VLSI Technology (01.06.2009)
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Published in 2009 Symposium on VLSI Technology (01.06.2009)
Conference Proceeding
Experimental Investigation on Superior PMOS Performance of Uniaxial Strained ≪110≫ Silicon Nanowire Channel By Embedded SiGe Source/Drain
Ming Li, Kyoung Hwan Yeo, Yun Young Yeoh, Sung Dae Suk, Keun Hwi Cho, Dong-Won Kim, Donggun Park, Won-Seong Lee
Published in 2007 IEEE International Electron Devices Meeting (01.12.2007)
Published in 2007 IEEE International Electron Devices Meeting (01.12.2007)
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Conference Proceeding
TSNWFET for SRAM cell application: Performance variation and process dependency
Sung Dae Suk, Yun Young Yeoh, Ming Li, Kyoung Hwan Yeo, Sung Han Kim, Dong Won Kim, Donggun Park, Won Seoung Lee
Published in 2008 Symposium on VLSI Technology (01.06.2008)
Published in 2008 Symposium on VLSI Technology (01.06.2008)
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Conference Proceeding
Fabrication and electrical characteristics of self-aligned (SA) gate-all-around (GAA) si nanowire MOSFETs (SNWFET)
Dong-Won Kim, Kyoung Hwan Yeo, Sung Dae Suk, Ming Li, Yun Young Yeoh, Dong Kyun Sohn, Chilhee Chung
Published in 2010 IEEE International Conference on Integrated Circuit Design and Technology (01.06.2010)
Published in 2010 IEEE International Conference on Integrated Circuit Design and Technology (01.06.2010)
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Conference Proceeding
Gate-all-around Twin Silicon nanowire SONOS Memory
Suk, Sung Dae, Yeo, Kyoung Hwan, Cho, Keun Hwi, Li, Ming, Yeoh, Yun young, Hong, Ki-Ha, Kim, Sung-Han, Koh, Young-Ho, Jung, Sunggon, Jang, WonJun, Kim, Dong-Won, Park, Donggun, Ryu, Byung-Il
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
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Conference Proceeding
Gate-all-around single silicon nanowire MOSFET with 7 nm width for SONOS NAND flash memory
Kyoung Hwan Yeo, Keun Hwi Cho, Ming Li, Sung Dae Suk, Yun-young Yeoh, Min-Sang Kim, Hyunjun Bae, Ji-Myoung Lee, Suk-Kang Sung, Jun Seo, Bokkyoung Park, Dong-Won Kim, Donggun Park, Won-Seoung Lee
Published in 2008 Symposium on VLSI Technology (01.06.2008)
Published in 2008 Symposium on VLSI Technology (01.06.2008)
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Conference Proceeding
Characterization of Gate-All-Around Si-NWFET, including Rsd, cylindrical coordinate based 1/f noise and hot carrier effects
Rock-Hyun Baek, Hyun-Sik Choi, Hyun Chul Sagong, Sang-Hyun Lee, Gil-Bok Choi, Seung Hyun Song, Chan-Hoon Park, Jeong-Soo Lee, Yoon-Ha Jeong, Chang-Ki Baek, Dae Mann Kim, Yun Young Yeoh, Kyoung Hwan Yeo, Dong-Won Kim, Kinam Kim
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
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Conference Proceeding
Gate-All-Around (GAA) Twin Silicon Nanowire MOSFET (TSNWFET) with 15 nm Length Gate and 4 nm Radius Nanowires
Kyoung Hwan Yeo, Sung Dae Suk, Ming Li, Yun-young Yeoh, Keun Hwi Cho, Ki-Ha Hong, SeongKyu Yun, Mong Sup Lee, Nammyun Cho, Kwanheum Lee, Duhyun Hwang, Bokkyoung Park, Dong-Won Kim, Donggun Park, Byung-Il Ryu
Published in 2006 International Electron Devices Meeting (01.12.2006)
Published in 2006 International Electron Devices Meeting (01.12.2006)
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