Analytical Model for Junctionless Double-Gate FET in Subthreshold Region
Shin, Yong Hyeon, Weon, Sungwoo, Hong, Daesik, Yun, Ilgu
Published in IEEE transactions on electron devices (01.04.2017)
Published in IEEE transactions on electron devices (01.04.2017)
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Journal Article
Effect of carrier concentration on optical bandgap shift in ZnO:Ga thin films
Kim, Chang Eun, Moon, Pyung, Kim, Sungyeon, Myoung, Jae-Min, Jang, Hyeon Woo, Bang, Jungsik, Yun, Ilgu
Published in Thin solid films (01.09.2010)
Published in Thin solid films (01.09.2010)
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Journal Article
A compact quantum correction model for symmetric double gate metal-oxide-semiconductor field-effect transistor
Cho, Edward Namkyu, Shin, Yong Hyeon, Yun, Ilgu
Published in Journal of applied physics (07.11.2014)
Published in Journal of applied physics (07.11.2014)
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Journal Article
Effects of channel thickness variation on bias stress instability of InGaZnO thin-film transistors
Cho, Edward Namkyu, Kang, Jung Han, Yun, Ilgu
Published in Microelectronics and reliability (01.09.2011)
Published in Microelectronics and reliability (01.09.2011)
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Journal Article
Conference Proceeding
Conduction instability of amorphous InGaZnO thin-film transistors under constant drain current stress
Kang, Jung Han, Cho, Edward Namkyu, Yun, Ilgu
Published in Microelectronics and reliability (01.09.2014)
Published in Microelectronics and reliability (01.09.2014)
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Journal Article
Conference Proceeding
Density-of-States Modeling of Solution-Processed InGaZnO Thin-Film Transistors
Chang Eun Kim, Cho, E N, Pyung Moon, Gun Hee Kim, Dong Lim Kim, Hyun Jae Kim, Ilgu Yun
Published in IEEE electron device letters (01.10.2010)
Published in IEEE electron device letters (01.10.2010)
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Journal Article
Field-dependent charge trapping analysis of ONO inter-poly dielectrics for NAND flash memory applications
Moon, Pyung, Lim, Jun Yeong, Youn, Tae-Un, Park, Sung-Kye, Yun, Ilgu
Published in Solid-state electronics (01.04.2014)
Published in Solid-state electronics (01.04.2014)
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Journal Article
Methodology for improvement of data retention in floating gate flash memory using leakage current estimation
Moon, Pyung, Lim, Jun Yeong, Youn, Tae-Un, Noh, Keum-Whan, Park, Sung-Kye, Yun, Ilgu
Published in Microelectronics and reliability (01.09.2013)
Published in Microelectronics and reliability (01.09.2013)
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Journal Article
Conference Proceeding
Predictive modeling and analysis of HfO2 thin film process based on Bayesian information criterion using PCA-based neural networks
Ko, Young-Don, Moon, Pyung, Kim, Chang Eun, Ham, Moon-Ho, Jeong, Myong-Kee, Garcia-Diaz, Alberto, Myoung, Jae-Min, Yun, Ilgu
Published in Surface and interface analysis (01.09.2013)
Published in Surface and interface analysis (01.09.2013)
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Journal Article
Formation of p-type ZnO film on InP substrate by phosphor doping
Bang, Kyu-Hyun, Hwang, Deuk-Kyu, Park, Min-Chul, Ko, Young-Don, Yun, Ilgu, Myoung, Jae-Min
Published in Applied surface science (15.04.2003)
Published in Applied surface science (15.04.2003)
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