Effects of driving capability on single-event transient of inverter in bulk FinFET Technology
Bai, Yang, Yue, Suge, Sun, Yu, Zhu, Yongqin, Yuan, Jingshuang, Li, Tongde, Wang, Liang
Published in Journal of physics. Conference series (01.08.2024)
Published in Journal of physics. Conference series (01.08.2024)
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Journal Article
Single Event Effect Characterization of High Speed Serial JESD204B Data Receiver
Li, Junze, Yue, Suge, Chen, Maoxin, Song, Xiaojing
Published in Journal of physics. Conference series (01.11.2019)
Published in Journal of physics. Conference series (01.11.2019)
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Journal Article
Total ionizing dose effects on data retention characteristics of 55nm SONOS flash
Guo, Xuanchen, Yue, Suge, Li, Jiancheng, Zhou, Tao, Zha, Qichao
Published in Journal of physics. Conference series (01.07.2021)
Published in Journal of physics. Conference series (01.07.2021)
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Journal Article
A Fast-Lock Low-Jitter PLL Based Adaptive Bandwidth Technique
Liu, Yajiao, Yue, Suge, Han, Xupeng, Liu, Jiaqi
Published in Journal of physics. Conference series (01.09.2018)
Published in Journal of physics. Conference series (01.09.2018)
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Journal Article
Impact of Program/Erase Cycles, Total Ionizing Dose and Data Bake on Data Retention of 55nm SONOS Flash
Guo, Xuanchen, Yue, Suge, Li, Jiancheng, Zhou, Tao, Zha, Qichao
Published in Journal of physics. Conference series (01.05.2021)
Published in Journal of physics. Conference series (01.05.2021)
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Journal Article
Total Ionizing Dose Influence on the Single-Event Multiple-Cell Upsets in 65-nm 6-T SRAM
Zheng, Qiwen, Cui, Jiangwei, Lu, Wu, Guo, Hongxia, Liu, Jie, Yu, Xuefeng, Wang, Liang, Liu, Jiaqi, He, Chengfa, Ren, Diyuan, Yue, Suge, Zhao, Yuanfu, Guo, Qi
Published in IEEE transactions on nuclear science (01.06.2019)
Published in IEEE transactions on nuclear science (01.06.2019)
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Journal Article
SEU and SET of 65 Bulk CMOS Flip-flops and Their Implications for RHBD
Zhao, Yuanfu, Wang, Liang, Yue, Suge, Wang, Dan, Zhao, Xinyuan, Sun, Yongshu, Li, Dongqiang, Wang, Fuqing, Yang, Xiaoqian, Zheng, Hongchao, Ma, Jianhua, Fan, Long
Published in IEEE transactions on nuclear science (01.12.2015)
Published in IEEE transactions on nuclear science (01.12.2015)
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Journal Article
A Study on High Density Gate-Oxide Anti-Fuse PROM Memory Cell Program Features
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Journal Article
Conference Proceeding
Design of a novel 12T radiation hardened memory cell tolerant to single event upsets (SEU)
Chunyan Hu, Suge Yue, Shijin Lu
Published in 2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM) (01.11.2017)
Published in 2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM) (01.11.2017)
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Conference Proceeding
A low-voltage CMOS low-dropout regulator with novel capacitor-multiplier frequency compensation
Yan, Zushu, Shen, Liangguo, Zhao, Yuanfii, Yue, S
Published in 2008 IEEE International Symposium on Circuits and Systems (01.01.2008)
Published in 2008 IEEE International Symposium on Circuits and Systems (01.01.2008)
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Conference Proceeding
Journal Article
A 8.0Gb/s source-series-terminated transmitter driver with 3 tap FFE for multi-standard applications in 65 nm CMOS
Yanan Chen, Suge Yue, Qiang Bian, Fei Shi
Published in 2016 International Conference on Control, Decision and Information Technologies (CoDIT) (01.04.2016)
Published in 2016 International Conference on Control, Decision and Information Technologies (CoDIT) (01.04.2016)
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Conference Proceeding
A 0.996mW 10GHz slicer with 20mV input resolution in 65nm CMOS
Yanan Chen, Suge Yue, Qiang Bian, Fei Shi
Published in 2016 China Semiconductor Technology International Conference (CSTIC) (01.03.2016)
Published in 2016 China Semiconductor Technology International Conference (CSTIC) (01.03.2016)
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Conference Proceeding
A wide input voltage range, output-capacitorless linear voltage regulator in 0.25UM BCD process
Wang, Danhui, Zhao, Yuanfu, Yue, Suge
Published in 2015 China Semiconductor Technology International Conference (01.03.2015)
Published in 2015 China Semiconductor Technology International Conference (01.03.2015)
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Conference Proceeding
Journal Article
Impact of gate shapes on single event transients
Zhao Xinyuan, Wang liang, Yue Suge
Published in 2014 IEEE International Conference on Electron Devices and Solid-State Circuits (01.06.2014)
Published in 2014 IEEE International Conference on Electron Devices and Solid-State Circuits (01.06.2014)
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Conference Proceeding
GDNMOS design for ESD protection in submicron CMOS VLSI
Li, Zhiguo, Suge, Yue, Yongshu, Sun
Published in 2009 Asia Pacific Conference on Postgraduate Research in Microelectronics & Electronics (PrimeAsia) (01.11.2009)
Published in 2009 Asia Pacific Conference on Postgraduate Research in Microelectronics & Electronics (PrimeAsia) (01.11.2009)
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Conference Proceeding
ESD device simulation in a pre-Si phase
Zhiguo Li, Suge Yue
Published in 2008 IEEE International Conference on Electron Devices and Solid-State Circuits (01.12.2008)
Published in 2008 IEEE International Conference on Electron Devices and Solid-State Circuits (01.12.2008)
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Conference Proceeding
An Efficient Design of Single Event Transients Tolerance for Logic Circuits
Yantu Mo, Suge Yue
Published in 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) (01.01.2008)
Published in 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) (01.01.2008)
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Conference Proceeding
New Latch-Up Model for Deep Sub-micron Integrated Circuits
Pan Dong, Long Fan, Suge Yue, Hongchao Zheng, Shougang Du
Published in 2011 IEEE Ninth International Conference on Dependable, Autonomic and Secure Computing (01.12.2011)
Published in 2011 IEEE Ninth International Conference on Dependable, Autonomic and Secure Computing (01.12.2011)
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Conference Proceeding
3D Simulation of transient current and charge collection induced by heavy ion in SOI transistors
Xiaochen Zhang, Suge Yue, Liang Wang
Published in 2010 IEEE Nanotechnology Materials and Devices Conference (01.10.2010)
Published in 2010 IEEE Nanotechnology Materials and Devices Conference (01.10.2010)
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Conference Proceeding