by Shih, J.R., Wang, J.J., Ken, W., Yeng Peng, Yue, J.T.
Published in 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual (2003)

by Shun-Yi Lee, Lai, J.B., Lee, S.C., Chu, L.H., Huang, Y.S., Shiue, R.Y., Peng, Y.K., Yue, J.T.
Published in 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) (2001)

by Jian-Hsing Lee, Shih, J.R., Tang, C.S., Liu, K.C., Wu, Y.H., Shiue, R.Y., Ong, T.C., Peng, Y.K., Yue, J.T.
Published in 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) (2002)

by Quader, K.N., Peng Fang, Yue, J.T., Ko, P.K., Chenming Hu
Published in IEEE transactions on electron devices (01.05.1994)

by Hao Fang, Peng Fang, Yue, J.T.
Published in IEEE electron device letters (01.11.1994)

by Shih, J.R., Chiang, M.C., Lin, H.C., Shiue, R.Y., Yeng Peng, Yue, J.T.
Published in 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) (2002)

by Chung-Yuan Tsao, Shiue, R.Y., Ting, C.C., Huang, Y.S., Lin, Y.C., Yue, J.T.
Published in 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) (2001)

by Hijab, R.S., Yue, J.T.
Published in International Report on Wafer Level Reliability Workshop (1992)

by Shih, J.R., Chu, J.H., Lee, J.H., Shiue, R.Y., Peng, Y.K., Yue, J.T.
Published in 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) (2001)

by Peng Fang, Li, P.C., Yue, J.T.
Published in Proceedings of 4th International Conference on Solid-State and IC Technology (1995)

by Peng Fang, Li, P.C., Yue, J.T.
Published in Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS) (1994)

by Ramaswami, S., Pham, V., Yue, J.T.
Published in Seventh International IEEE Conference on VLSI Multilevel Interconnection (1990)

by Wang, R.C.J., Shih, J.R., Chu, L.H., Doong, K.Y.Y., Wang, L.S., Weil, P.C., Su, D.S., Yang, C.T., Chiu, C.C., Su, D., Peng, Y.K., Yue, J.T., Lee, J.Y.M.
Published in Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) (2002)

by Quader, K.N., Ko, P.K., Hu, C., Fang, P., Yue, J.T.
Published in 30th Annual Proceedings Reliability Physics 1992 (1992)

by Rakkhit, R., Yue, J.T.
Published in 29th Annual Proceedings Reliability Physics 1991 (1991)

by Yue, A.S, Yue, J.T
Published in Journal of crystal growth (01.05.1972)

by Fukuchi, Takeo, Sawaguchi, Shoichi, Yue, Beatricey J.T., Iwata, Kazuo, Hara, Hiroaki, Kaiya, Tadayoshi
Published in Experimental eye research (01.02.1994)

by Bui, N.D., Pham, V.H., Yue, J.T., Wollesen, D.L.
Published in Seventh International IEEE Conference on VLSI Multilevel Interconnection (1990)

by Yue, J.T., Funsten, W.P., Taylor, R.V.
Published in 23rd International Reliability Physics Symposium (01.03.1985)

by Lin, M.R., Yue, J.T.
Published in 24th International Reliability Physics Symposium (01.04.1986)