Effect of Drift Length on Shifts in 400-V SOI LDMOS Breakdown Voltage Due to TID
Shu, Lei, Zhao, Yuan-Fu, Galloway, Kenneth F., Wang, Liang, Wang, Xin-Sheng, Yuan, Zhang-Yi'an, Zhou, Xin, Chen, Wei-Ping, Qiao, Ming, Wang, Tian-Qi
Published in IEEE transactions on nuclear science (01.11.2020)
Published in IEEE transactions on nuclear science (01.11.2020)
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Journal Article
Numerical and Experimental Investigation of TID Radiation Effects on the Breakdown Voltage of 400-V SOI NLDMOSFETs
Shu, Lei, Wang, Liang, Zhou, Xin, Li, Tong-De, Yuan, Zhang-Yi'an, Sui, Cheng-Long, Li, Yuan, Wang, Bi, Zhao, Yuan-Fu, Galloway, Kenneth F.
Published in IEEE transactions on nuclear science (01.04.2019)
Published in IEEE transactions on nuclear science (01.04.2019)
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Journal Article
TID Effects on Soft-breakdown and Self-heating Characteristics of 400V SOI NLDMOSFETs
Shu, Lei, Wang, Liang, Zhou, Xin, Li, Yuan, Li, Tong-De, Yuan, Zhang-Yi'an, Sui, Cheng-Long, Zhao, Yuan-Fu
Published in 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2018)
Published in 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2018)
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Conference Proceeding