Layout Guidelines against Charging Damage from the Well-Side Antennas in Separated Power Domains
Kuo, Hsi-Yu, Chu, Yu-Lin, Dai, Hung-Da, Wang, Chun-Chi, Lin, Pei-Jung, Kuo, Shu-Cheng, Guo, Ethan, Zhang, Ya-Min, Su, Yu-Ti, Hsu, Chia-Lin, Chen, Kuan-Hung, Chen, Tsung-Yuan, Li, Te-Liang, Huang, Ray, Chen, Kuo-Ji, Song, Ming-Hsiang, Lu, Ryan, Xia, Kejun
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
Protection Schemes for Plasma Induced Damage from Well-Side Antennas
Kuo, Hsi-Yu, Chu, Yu-Lin, Dai, Hung-Da, Wang, Chun-Chi, Lin, Pei-Jung, Guo, Ethan, Su, Yu-Ti, Hsu, Chia-Lin, Chen, Kuan-Hung, Chen, Tsung-Yuan, Lu, Ryan, Liang, Victor, Chen, Kuo-Ji, Xia, Kejun
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
FinFET SCR structure optimization for high-speed serial links ESD protection
Li-Wei Chu, Yi-Feng Chang, Yu-Ti Su, Kuo-Ji Chen, Ming-Hsiang Song, Jam-Wem Lee
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
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Conference Proceeding
A Hybrid Design Framework for Video Streaming in IEEE 802.11e Wireless Network
Hung-Chin Jang, Yu-Ti Su
Published in 22nd International Conference on Advanced Information Networking and Applications (aina 2008) (01.03.2008)
Published in 22nd International Conference on Advanced Information Networking and Applications (aina 2008) (01.03.2008)
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Conference Proceeding
Low-Capacitance SCR for On-Chip ESD Protection with High CDM Tolerance in 7nm Bulk FinFET Technology
Peng, Po-Lin, Chu, Li-Wei, Tsai, Ming-Fu, Su, Yu-Ti, Lee, Jam-Wem, Chen, Kuo-Ji, Song, Ming-Hsiang
Published in 2019 41st Annual EOS/ESD Symposium (EOS/ESD) (01.09.2019)
Published in 2019 41st Annual EOS/ESD Symposium (EOS/ESD) (01.09.2019)
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Cumulative electrostatic discharge induced degradation of power-rail ESD clamp device in high-voltage CMOS/DMOS technologies
Chung-Ti Hsu, Shu-Chuan Chen, Yen-Hsien Chen, Yu-Ti Su, Ming-Fang Lai, Che-Hung Chen, Po-An Chen
Published in APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems (01.11.2008)
Published in APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems (01.11.2008)
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Conference Proceeding
High CDM resistant low-cap SCR for 0.9V advanced CMOS technology
Yu-Ti Su, Tzu-Heng Chang, Tsung-Che Tsai, Li-Wei Chu, Jen-Chou Tseng, Ming-Hsiang Song
Published in 2013 35th Electrical Overstress/Electrostatic Discharge Symposium (01.09.2013)
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Published in 2013 35th Electrical Overstress/Electrostatic Discharge Symposium (01.09.2013)
Conference Proceeding
CMOS Latch-up Improvement: Embedded Active Collector in FinFET Technology
Huang, Chien-Yao, Lin, Wun-Jie, Su, Yu-Ti, Lee, Jam-Wem, Chen, Kuo-Ji, Song, Ming-Hsiang
Published in 2022 44th Annual EOS/ESD Symposium (EOS/ESD) (18.09.2022)
Published in 2022 44th Annual EOS/ESD Symposium (EOS/ESD) (18.09.2022)
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