The Study On Reducing Bit-Line Parasitic Capacitance In Advanced DRAM
Yu, Yexiao, Ma, Hong, Liu, Zhongming, Xiong, Shaoyou, Wang, Dan, Zhang, Yang, Yang, Yi
Published in 2023 China Semiconductor Technology International Conference (CSTIC) (26.06.2023)
Published in 2023 China Semiconductor Technology International Conference (CSTIC) (26.06.2023)
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Conference Proceeding
The Study of Bit Line to Storage Node Contact Leakage in Advanced DRAM
Yu, Yexiao, Liu, Zhongming, Cui, Jingsi, Kong, Zhong, Xiong, GuoBao, Ma, Hong
Published in 2022 IEEE 5th International Conference on Electronics Technology (ICET) (13.05.2022)
Published in 2022 IEEE 5th International Conference on Electronics Technology (ICET) (13.05.2022)
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Conference Proceeding