Interface Engineering of Trench-Ox for Modern DRAM Devices
Hwang, Soojung, Kim, Jongkyu, Kim, Juntae, Cha, Dahyun, Kim, Minho, Jang, Dongkyu, Cho, Sunghak, Kim, Seokhyang, Park, Jaeseong, Kim, Hyungjoon, Yu, Sukwon, Song, Boyoung, Ban, Hyodong
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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