A Fast Prototyping Framework for Analog Layout Migration With Planar Preservation
Pan, Po-Cheng, Chin, Ching-Yu, Chen, Hung-Ming, Chen, Tung-Chieh, Lee, Chin-Chieh, Lin, Jou-Chun
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.09.2015)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.09.2015)
Get full text
Journal Article
Escaped Boundary Pins Routing for High-Speed Boards
Ching-Yu Chin, Chung-Yi Kuan, Tsung-Ying Tsai, Hung-Ming Chen, Kajitani, Y.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.03.2013)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.03.2013)
Get full text
Journal Article
Prior cancer history predicts the worse survival of patients with nasopharyngeal carcinoma
Yeh, Chien-Fu, Chin, Yu-Ching, Huang, Wei‑Hao, Lan, Ming-Ying
Published in European archives of oto-rhino-laryngology (01.11.2022)
Published in European archives of oto-rhino-laryngology (01.11.2022)
Get full text
Journal Article
Pretreatment age and serum lactate dehydrogenase as predictors of synchronous second primary cancer in patients with nasopharyngeal carcinoma
Yeh, Chien-Fu, Ho, Ching-Yin, Chin, Yu-Ching, Shu, Chih-Hung, Chao, Yun-Ting, Lan, Ming-Ying
Published in Oral oncology (01.11.2020)
Published in Oral oncology (01.11.2020)
Get full text
Journal Article
Excessive Expression of Microglia/Macrophage and Proinflammatory Mediators in Olfactory Bulb and Olfactory Dysfunction After Stroke
Yeh, Chien-Fu, Chuang, Tung-Yueh, Lan, Ming-Ying, Chin, Yu-Ching, Wang, Wei-Hsin, Lin, Yung-Yang
Published in In vivo (Athens) (01.11.2019)
Published in In vivo (Athens) (01.11.2019)
Get full text
Journal Article
Mathematical yield estimation for two-dimensional-redundancy memory arrays
Chao, Mango C.-T, Ching-Yu Chin, Chen-Wei Lin
Published in 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2010)
Published in 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2010)
Get full text
Conference Proceeding
Simultaneous escape routing on multiple components for dense PCBs
Ching-Yu Chin, Hung-Ming Chen
Published in 2013 IEEE Electrical Design of Advanced Packaging Systems Symposium (EDAPS) (01.12.2013)
Published in 2013 IEEE Electrical Design of Advanced Packaging Systems Symposium (EDAPS) (01.12.2013)
Get full text
Conference Proceeding
On simultaneous escape routing of length matching differential signalings
Yen-Jung Lee, Hung-Ming Chen, Ching-Yu Chin
Published in 2013 IEEE Electrical Design of Advanced Packaging Systems Symposium (EDAPS) (01.12.2013)
Published in 2013 IEEE Electrical Design of Advanced Packaging Systems Symposium (EDAPS) (01.12.2013)
Get full text
Conference Proceeding
A fast thermal aware placement with accurate thermal analysis based on Green function
Aroonsantidecha, S., Liu, S. S-Y, Ching-Yu Chin, Hung-Ming Chen
Published in 17th Asia and South Pacific Design Automation Conference (01.01.2012)
Published in 17th Asia and South Pacific Design Automation Conference (01.01.2012)
Get full text
Conference Proceeding
A novel test flow for one-time-programming applications of NROM technology
Ching-Yu Chin, Yao-Te Tsou, Chi-Min Chang, Chao, M.C.-T.
Published in 2009 International Test Conference (01.11.2009)
Published in 2009 International Test Conference (01.11.2009)
Get full text
Conference Proceeding
Fault models for embedded-DRAM macros
Chao, Mango C.-T., Yang, Hao-Yu, Huang, Rei-Fu, Lin, Shih-Chin, Chin, Ching-Yu
Published in 2009 46th ACM/IEEE Design Automation Conference (26.07.2009)
Published in 2009 46th ACM/IEEE Design Automation Conference (26.07.2009)
Get full text
Conference Proceeding
An analytical placer for heterogeneous FPGAs via rough-placed packing
Wan-Ning Wu, Chen Chen, Ching-Yu Chin, Chun-Kai Wang, Hung-Ming Chen
Published in 2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) (01.04.2017)
Published in 2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) (01.04.2017)
Get full text
Conference Proceeding