A 64Mb SRAM in 22nm SOI technology featuring fine-granularity power gating and low-energy power-supply-partition techniques for 37% leakage reduction
Pilo, H., Adams, C. A., Arsovski, I., Houle, R. M., Lamphier, S. M., Lee, M. M., Pavlik, F. M., Sambatur, S. N., Seferagic, A., Wu, R., Younus, M. I.
Published in 2013 IEEE International Solid-State Circuits Conference Digest of Technical Papers (01.02.2013)
Published in 2013 IEEE International Solid-State Circuits Conference Digest of Technical Papers (01.02.2013)
Get full text
Conference Proceeding
Ultralow-power SRAM technology
Mann, R. W., Abadeer, W. W., Breitwisch, M. J., Bula, O., Brown, J. S., Colwill, B. C., Cottrell, P. E., Crocco, W. T., Furkay, S. S., Hauser, M. J., Hook, T. B., Hoyniak, D., Johnson, J. M., Lam, C. M., Mih, R. D., Rivard, J., Moriwaki, A., Phipps, E., Putnam, C. S., Rainey, B. A., Toomey, J. J., Younus, M. I.
Published in IBM journal of research and development (01.09.2003)
Published in IBM journal of research and development (01.09.2003)
Get full text
Journal Article
Phase Calibration Technique for Mismatch Optimization in Image-Reject Receivers
Younus, Md Iqbal, Ismail, Mohammed
Published in Analog integrated circuits and signal processing (01.02.2006)
Published in Analog integrated circuits and signal processing (01.02.2006)
Get full text
Journal Article
DRC-free high density layout exploration with layout morphing and patterning quality assessment, with application to SRAM
Singhee, A., Acar, E., Younus, M. I., Singh, R. N., Bansal, A.
Published in Thirteenth International Symposium on Quality Electronic Design (ISQED) (01.03.2012)
Published in Thirteenth International Symposium on Quality Electronic Design (ISQED) (01.03.2012)
Get full text
Conference Proceeding
A novel phase unwrapping algorithm and its application to phase stepped interferometry
Younus, I., Hardie, R.C., Blackshire, J.
Published in Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185) (1998)
Published in Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185) (1998)
Get full text
Conference Proceeding