High-stability pH sensing with a few-layer MoS2 field-effect transistor
Wang, Honglei, Zhao, Peng, Zeng, Xuan, Young, Chadwin D, Hu, Walter
Published in Nanotechnology (13.09.2019)
Published in Nanotechnology (13.09.2019)
Get full text
Journal Article
A Comprehensive Study on the Effect of TiN Top and Bottom Electrodes on Atomic Layer Deposited Ferroelectric Hf0.5Zr0.5O2 Thin Films
Kim, Si Joon, Mohan, Jaidah, Kim, Harrison Sejoon, Hwang, Su Min, Kim, Namhun, Jung, Yong Chan, Sahota, Akshay, Kim, Kihyun, Yu, Hyun-Yong, Cha, Pil-Ryung, Young, Chadwin D., Choi, Rino, Ahn, Jinho, Kim, Jiyoung
Published in Materials (02.07.2020)
Published in Materials (02.07.2020)
Get full text
Journal Article
Stress-Induced Crystallization of Thin Hf 1- X Zr X O 2 Films: The Origin of Enhanced Energy Density with Minimized Energy Loss for Lead-Free Electrostatic Energy Storage Applications
Kim, Si Joon, Mohan, Jaidah, Lee, Joy S, Kim, Harrison Sejoon, Lee, Jaebeom, Young, Chadwin D, Colombo, Luigi, Summerfelt, Scott R, San, Tamer, Kim, Jiyoung
Published in ACS applied materials & interfaces (06.02.2019)
Published in ACS applied materials & interfaces (06.02.2019)
Get full text
Journal Article
Evaluation of border traps and interface traps in HfO2/MoS2 gate stacks by capacitance-voltage analysis
Zhao, Peng, Khosravi, Ava, Azcatl, Angelica, Bolshakov, Pavel, Mirabelli, Gioele, Caruso, Enrico, Hinkle, Christopher L, Hurley, Paul K, Wallace, Robert M, Young, Chadwin D
Published in 2d materials (10.04.2018)
Published in 2d materials (10.04.2018)
Get full text
Journal Article
Probing Interface Defects in Top-Gated MoS2 Transistors with Impedance Spectroscopy
Zhao, Peng, Azcatl, Angelica, Gomeniuk, Yuri Y, Bolshakov, Pavel, Schmidt, Michael, McDonnell, Stephen J, Hinkle, Christopher L, Hurley, Paul K, Wallace, Robert M, Young, Chadwin D
Published in ACS applied materials & interfaces (19.07.2017)
Published in ACS applied materials & interfaces (19.07.2017)
Get full text
Journal Article
A New Analytical Tool for the Study of Radiation Effects in 3-D Integrated Circuits: Near-Zero Field Magnetoresistance Spectroscopy
Ashton, James P., Moxim, Stephen J., Lenahan, Patrick M., Mckay, Colin G., Waskiewicz, Ryan J., Myers, Kenneth J., Flatte, Michael E., Harmon, Nicholas J., Young, Chadwin D.
Published in IEEE transactions on nuclear science (01.01.2019)
Published in IEEE transactions on nuclear science (01.01.2019)
Get full text
Journal Article
Investigation of negative bias temperature instability dependence on fin width of silicon-on-insulator-fin-based field effect transistors
Young, Chadwin D., Neugroschel, Arnost, Majumdar, Kausik, Matthews, Ken, Wang, Zhe, Hobbs, Chris
Published in Journal of applied physics (21.01.2015)
Published in Journal of applied physics (21.01.2015)
Get full text
Journal Article
Robust SiNx/GaN MIS-HEMTs With Crystalline Interfacial Layer Using Hollow Cathode PEALD
Meng, Xin, Lee, Jaebeom, Ravichandran, Arul, Byun, Young-Chul, Lee, Jae-Gil, Lucero, Antonio T., Kim, Si Joon, Ha, Min-Woo, Young, Chadwin D., Kim, Jiyoung
Published in IEEE electron device letters (01.08.2018)
Published in IEEE electron device letters (01.08.2018)
Get full text
Journal Article
Evaluation of Lab-based Lithium Niobate Surface Acoustic Wave Test Structure Using Efficient Maskless Lithography and SMA Connection Approach for Microfluidic Applications
Parvez, Mohammad Salman, Hussain, Shadhin, Goeckner, Matthew, Young, Chadwin D., Lee, Jeong-Bong JB
Published in 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) (15.04.2024)
Published in 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) (15.04.2024)
Get full text
Conference Proceeding
Ultrasensitive Perovskite Photodetector Achieved When Configured with a Si Metal Oxide Semiconductor Field‐Effect Transistor
Liu, Jinbo, Haroldson, Ross, Verkhogliadov, Grigorii, Lin, Dayang, Gu, Qing, Zakhidov, Anvar A., Hu, Walter, Young, Chadwin D.
Published in Advanced photonics research (01.01.2023)
Published in Advanced photonics research (01.01.2023)
Get full text
Journal Article
Introduction of a Reset MOSFET to Mitigate the Influence of Ionic Movement in Perovskite MOSFET Photodetector Measurements
Liu, Jinbo, Haroldson, Ross, Verkhogliadov, Grigorii, Lin, Dayang, Gu, Qing, Zakhidov, Anvar A, Hu, Wenchuang, Young, Chadwin D
Published in 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) (21.03.2022)
Published in 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) (21.03.2022)
Get full text
Conference Proceeding
Understanding the Impact of Annealing on Interface and Border Traps in the Cr/HfO2/Al2O3/MoS2 System
Zhao, Peng, Padovani, Andrea, Bolshakov, Pavel, Khosravi, Ava, Larcher, Luca, Hurley, Paul K, Hinkle, Christopher L, Wallace, Robert M, Young, Chadwin D
Published in ACS applied electronic materials (27.08.2019)
Published in ACS applied electronic materials (27.08.2019)
Get full text
Journal Article
Direct Observation of Large Atomic Polar Displacements in Epitaxial Barium Titanate Thin Films
Wu, HsinWei, Lu, Sirong, Aoki, Toshihiro, Ponath, Patrick, Wang, Jian, Young, Chadwin, Ekerdt, John G., McCartney, Martha R., Smith, David J.
Published in Advanced materials interfaces (01.08.2020)
Published in Advanced materials interfaces (01.08.2020)
Get full text
Journal Article
Engineering the Palladium–WSe2 Interface Chemistry for Field Effect Transistors with High-Performance Hole Contacts
Smyth, Christopher M, Walsh, Lee A, Bolshakov, Pavel, Catalano, Massimo, Addou, Rafik, Wang, Luhua, Kim, Jiyoung, Kim, Moon J, Young, Chadwin D, Hinkle, Christopher L, Wallace, Robert M
Published in ACS applied nano materials (25.01.2019)
Published in ACS applied nano materials (25.01.2019)
Get full text
Journal Article
Engineering the interface chemistry for scandium electron contacts in WSe2 transistors and diodes
Smyth, Christopher M, Walsh, Lee A, Bolshakov, Pavel, Catalano, Massimo, Schmidt, Michael, Sheehan, Brendan, Addou, Rafik, Wang, Luhua, Kim, Jiyoung, Kim, Moon J, Young, Chadwin D, Hinkle, Christopher L, Wallace, Robert M
Published in 2d materials (01.10.2019)
Published in 2d materials (01.10.2019)
Get full text
Journal Article
Probing Interface Defects in Top-Gated MoS 2 Transistors with Impedance Spectroscopy
Zhao, Peng, Azcatl, Angelica, Gomeniuk, Yuri Y, Bolshakov, Pavel, Schmidt, Michael, McDonnell, Stephen J, Hinkle, Christopher L, Hurley, Paul K, Wallace, Robert M, Young, Chadwin D
Published in ACS applied materials & interfaces (19.07.2017)
Published in ACS applied materials & interfaces (19.07.2017)
Get full text
Journal Article