Origin of Device Performance Enhancement of Junctionless Accumulation-Mode (JAM) Bulk FinFETs With High- \kappa Gate Spacers
Ji Hun Choi, Tae Kyun Kim, Jung Min Moon, Young Gwang Yoon, Byeong Woon Hwang, Dong Hyun Kim, Seok-Hee Lee
Published in IEEE electron device letters (01.12.2014)
Published in IEEE electron device letters (01.12.2014)
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Journal Article
First Demonstration of Junctionless Accumulation-Mode Bulk FinFETs With Robust Junction Isolation
Kim, Tae Kyun, Kim, Dong Hyun, Yoon, Young Gwang, Moon, Jung Min, Hwang, Byeong Woon, Moon, Dong-Il, Lee, Gi Seong, Lee, Dong Wook, Yoo, Dong Eun, Hwang, Hae Chul, Kim, Jin Soo, Choi, Yang-Kyu, Cho, Byung Jin, Lee, Seok-Hee
Published in IEEE electron device letters (01.12.2013)
Published in IEEE electron device letters (01.12.2013)
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Journal Article