A Technology-Computer-Aided-Design-Based Reliability Prediction Model for DRAM Storage Capacitors
Choi, Woo Young, Yoon, Gyuhan, Chung, Woo Young, Cho, Younghoon, Shin, Seongun, Ahn, Kwang Ho
Published in Micromachines (Basel) (17.04.2019)
Published in Micromachines (Basel) (17.04.2019)
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Journal Article
On-current Modeling of 70-nm PMOSFETs Dependent on Hot-carrier Stress Bias Conditions
Choi, Woo Young, Lim, In Eui, Jhon, Heesauk, Yoon, Gyuhan
Published in Journal of semiconductor technology and science (01.04.2018)
Published in Journal of semiconductor technology and science (01.04.2018)
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Journal Article
Influence of Electron and Hole Distribution on 2T SONOS Embedded NVM
Choi, Woo Young, Kim, Da Som, Lee, Tae Ho, Kwon, Young Jun, Park, Sung-Kun, Yoon, Gyuhan
Published in Journal of semiconductor technology and science (01.10.2016)
Published in Journal of semiconductor technology and science (01.10.2016)
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Journal Article
On-State Resistance Instability of Programmed Antifuse Cells during Read Operation
Han, Jae Hwan, Lee, Hyunjin, Kim, Wansoo, Yoon, Gyuhan, Choi, Woo Young
Published in Journal of semiconductor technology and science (01.10.2014)
Published in Journal of semiconductor technology and science (01.10.2014)
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Journal Article
FLOATING-BASE BJT TYPE ESD DEVICE FOR RFID CHIP
CHUNG, JINYONG, KANG, HEE-BOK, HONG, SUK-KYOUNG, YOON, GYUHAN, SUNG, MAN YOUNG, CHOI, BOK-GIL
Published in Integrated ferroelectrics (01.01.2009)
Published in Integrated ferroelectrics (01.01.2009)
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Journal Article
2T-SONOS Cell Using Novel Process Integration on HV-CMOS Platform for Versatile Application
Park, Sung-Kun, Kwon, Young-Jun, Lee, Tae-Ho, Choi, Woo Young, Yoon, Gyuhan, Lee, Jun-Ho, Kim, Seung-Duk, Joo, Young-Dong, Song, Bok-Nam, Cho, In-Wook
Published in 2019 IEEE 11th International Memory Workshop (IMW) (01.05.2019)
Published in 2019 IEEE 11th International Memory Workshop (IMW) (01.05.2019)
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Conference Proceeding