Study on the Vt variation and bias temperature instability characteristics of TiN/W and TiN metal buried-gate transistor in DRAM application
Tae-Su Jang, Kyung-do Kim, Min-Soo Yoo, Yong-Taik Kim, Seon-Yong Cha, Jae-Goan Jeong, Seok-Hee Lee
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
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Conference Proceeding
A novel method to characterize the effect from the diffusion of Cu in through silicon via (TSV)
Kim, Kyung-Do, Kim, Kwi-Wook, Yoo, Min-Soo, Kim, Yong-Taik, Park, Sung-Kye, Hong, Sung-Joo, Park, Chan-Hyeong, Park, Byung-Gook, Lee, Jong-Ho
Published in 2015 IEEE International Electron Devices Meeting (IEDM) (01.12.2015)
Published in 2015 IEEE International Electron Devices Meeting (IEDM) (01.12.2015)
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Conference Proceeding
Journal Article
Highly scalable Z-RAM with remarkably long data retention for DRAM application
Tae-Su Jang, Joong-Sik Kim, Sang-Min Hwang, Young-Hoon Oh, Kwang-Myung Rho, Seoung-Ju Chung, Su-Ock Chung, Jae-Geun Oh, Bhardwaj, S., Jungtae Kwon, Kim, D., Nagoga, M., Yong-Taik Kim, Seon-Yong Cha, Seung-Chan Moon, Sung-Woong Chung, Sung-Joo Hong, Sung-Wook Park
Published in 2009 Symposium on VLSI Technology (01.06.2009)
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Published in 2009 Symposium on VLSI Technology (01.06.2009)
Conference Proceeding
STI stress-induced degradation of data retention time in DRAM and a new characterizing method for mechanical stress
Tae-Su Jang, Kyung-do Kim, Min-Soo Yoo, Yong-Taik Kim, Seon-Yong Cha, Jae-Goan Jeong, Sung-Joo Hong
Published in 2011 International Reliability Physics Symposium (01.04.2011)
Published in 2011 International Reliability Physics Symposium (01.04.2011)
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Conference Proceeding
Study on the Sub-Threshold Margin Characteristics of the Extremely Scaled 3-D DRAM Cell Transistors
Kyung Kyu Min, Il-Woong Kwon, Seehe Cho, Mikyung Kwon, Tae-Su Jang, Tae-Kyung Oh, Yong-Taik Kim, Seon-Yong Cha, Sung-Kye Park, Sung-Joo Hong
Published in 2015 IEEE International Memory Workshop (IMW) (01.05.2015)
Published in 2015 IEEE International Memory Workshop (IMW) (01.05.2015)
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Conference Proceeding