Differential integrated crosstalk noise (ICN) reduction among multiple differential BGA and Via pairs by using design of experiments (DoE) method
Bichen Chen, Muqi Ouyang, Shaohui Yong, Yansheng Wang, Junda Wang, Shuai Jin, Yadong Bai, Yan Zhou, Jun Fan
Published in 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) (01.08.2017)
Published in 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) (01.08.2017)
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Conference Proceeding
Dielectric Loss Tangent Extraction Using Modal Measurements and 2-D Cross-Sectional Analysis for Multilayer PCBs
Yong, Shaohui, Khilkevich, Victor, Liu, Yuanzhuo, Gao, Han, Hinaga, Scott, De, Soumya, Padilla, Darja, Yanagawa, Douglas, Drewniak, James
Published in IEEE transactions on electromagnetic compatibility (01.08.2020)
Published in IEEE transactions on electromagnetic compatibility (01.08.2020)
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Journal Article
S-Parameter De-Embedding Error Estimation Based on the Statistical Circuit Models of Fixtures
Liu, Yuanzhuo, Yong, Shaohui, Gao, Han, Hinaga, Scott, Padilla, Darja, Yanagawa, Douglas, Drewniak, James L., Khilkevich, Victor
Published in IEEE transactions on electromagnetic compatibility (01.08.2020)
Published in IEEE transactions on electromagnetic compatibility (01.08.2020)
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Journal Article
Modeling Strategy for EMI Filters
He, Ruijie, Xu, Yang, Walunj, Sameer, Yong, Shaohui, Khilkevich, Victor, Pommerenke, David, Aichele, Hermann L., Boettcher, Martin, Hillenbrand, Philipp, Klaedtke, Andreas
Published in IEEE transactions on electromagnetic compatibility (01.08.2020)
Published in IEEE transactions on electromagnetic compatibility (01.08.2020)
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Journal Article
Comprehensive and Practical Way to Look at Far-End Crosstalk for Transmission Lines With Lossy Conductor and Dielectric
Yong, Shaohui, Khilkevich, Victor, Cai, Xiao-Ding, Sui, Chunchun, Sen, Bidyut, Fan, Jun
Published in IEEE transactions on electromagnetic compatibility (01.04.2020)
Published in IEEE transactions on electromagnetic compatibility (01.04.2020)
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Journal Article
Prepreg and Core Dielectric Permittivity (ϵr) Extraction for Fabricated Striplines' Far-End Crosstalk Modeling
Yong, Shaohui, Penugonda, Srinath, Kim, DongHyun, Khilkevich, Victor, Pu, Bo, Ye, Xiaoning, Gao, Qian, Cai, Xiao-Ding, Sen, Bidyut, Fan, Jun
Published in IEEE transactions on electromagnetic compatibility (01.02.2022)
Published in IEEE transactions on electromagnetic compatibility (01.02.2022)
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Journal Article
Far-End Crosstalk Modeling and Prediction for Stripline With Inhomogeneous Dielectric Layers (IDLs)
Liu, Yuanzhuo, Yong, Shaohui, Guo, Yuandong, He, Jiayi, Li, Chaofeng, Ye, Xiaoning, Fan, Jun, Kim, DongHyun
Published in IEEE transactions on signal and power integrity (2022)
Published in IEEE transactions on signal and power integrity (2022)
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Journal Article
An Empirical Modeling of Far-end Crosstalk and Insertion Loss in Microstrip Lines
Liu, Yuanzhuo, Yong, Shaohui, Guo, Yuandong, He, Jiayi, Li, Chaofeng, Ye, Xiaoning, Fan, Jun, Khilkevich, Victor, Kim, DongHyun
Published in IEEE transactions on signal and power integrity (2022)
Published in IEEE transactions on signal and power integrity (2022)
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Journal Article
Dielectric Constant Extraction for Microstrip Transmission Lines Based on S-parameter Measurements and Cross-section
Liu, Yuanzhuo, Yong, Shaohui, Li, Jiangshuai, Khilkevich, Victor
Published in 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium (26.07.2021)
Published in 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium (26.07.2021)
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Conference Proceeding
Auto Focus for Far Field Source Localization Using Emission Source Microscopy
Zhang, Ling, Yong, Shaohui, Liu, Yuanzhuo, Khilkevich, Victor
Published in 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium (26.07.2021)
Published in 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium (26.07.2021)
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Conference Proceeding
Automatic sparse ESM scan using Gaussian process regression
Li, Jiangshuai, Zhou, Jiahao, Yong, Shaohui, Liu, Yuanzhuo, Khilkevich, Victor
Published in 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) (01.07.2020)
Published in 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) (01.07.2020)
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Conference Proceeding
The Simulated TDR Impedance In PCB Material Characterization
Guo, Yuandong, Kim, DongHyun, He, Jiayi, Yong, Shaohui, Liu, Yuanzhuo, Pu, Bo, Ye, Xiaoning, Fan, Jun
Published in 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium (26.07.2021)
Published in 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium (26.07.2021)
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Conference Proceeding
Limitations of First-Order Surface Impedance Boundary Condition and Its Effect on 2D Simulations for PCB Transmission Lines
Guo, Yuandong, Kim, DongHyun, He, Jiayi, Yong, Shaohui, Liu, Yuanzhuo, Ye, Xiaoning, Fan, Jun
Published in 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) (01.07.2020)
Published in 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) (01.07.2020)
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Conference Proceeding
Generic Modeling of Differential Striplines Using Machine Learning Based Regression Analysis
Penugonda, Srinath, Yong, Shaohui, Gao, Anna, Cai, Kevin, Sen, Bidyut, Fan, Jun
Published in 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) (01.07.2020)
Published in 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) (01.07.2020)
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Conference Proceeding
Resistance Modeling for Striplines with Different Surface Roughness on the Planes
Yong, Shaohui, Khilkevich, Victor, Liu, Yuanzhuo, He, Jiayi, Gao, Han, Hinaga, Scott, Padilla, Darja, Yanagawa, Douglas, Fan, Jun, Drewniak, James
Published in 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) (01.07.2020)
Published in 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) (01.07.2020)
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Conference Proceeding