by HOSSAIN, Fakir Sharif, YONEDA, Tomokazu, INOUE, Michiko
Published in IEICE Transactions on Information and Systems (01.01.2017)

by MAYUGA, Gian, YAMATO, Yuta, YONEDA, Tomokazu, SATO, Yasuo, INOUE, Michiko
Published in IEICE Transactions on Information and Systems (01.10.2016)

by Hyunbean Yi, Yoneda, T., Inoue, M., Sato, Y., Kajihara, S., Fujiwara, H.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.11.2012)

by Yi, Hyunbean, Yoneda, Tomokazu, Inoue, Michiko
Published in Journal of semiconductor technology and science (01.02.2014)

by INOUE, Michiko, TAKETANI, Akira, YONEDA, Tomokazu, FUJIWARA, Hideo
Published in IEICE Transactions on Information and Systems (2012)

by Yamato, Y., Yoneda, T., Hatayama, K., Inoue, M.
Published in 2012 IEEE International Test Conference (01.01.2012)

by Yi, Hyunbean, Yoneda, Tomokazu, Inoue, Michiko
Published in Journal of semiconductor technology and science (2014)

by Fujiwara, H., Iwata, H., Yoneda, T., Chia Yee Ooi
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.09.2008)

by Yoneda, T., Hori, K., Inoue, M., Fujiwara, H.
Published in 2011 IEEE International Test Conference (01.09.2011)

by Yoneda, Tomokazu, Inoue, Michiko, Sato, Yasuo, Fujiwara, Hideo
Published in 2010 28th VLSI Test Symposium (VTS) (01.04.2010)

by YONEDA, Tomokazu, SHUTO, Akiko, ICHIHARA, Hideyuki, INOUE, Tomoo, FUJIWARA, Hideo
Published in IEICE Transactions on Information and Systems (2010)

by Kajihara, Seiji, Ohtake, Satoshi, Yoneda, Tomokazu
Published in IPSJ Transactions on System LSI Design Methodology (2011)

by YONEDA, Tomokazu, MASUDA, Kimihiko, FUJIWARA, Hideo
Published in IEICE Transactions on Information and Systems (2008)

by HUSSIN, Fawnizu Azmadi, YONEDA, Tomokazu, FUJIWARA, Hideo
Published in IEICE Transactions on Information and Systems (2008)

by HUSSIN, Fawnizu Azmadi, YONEDA, Tomokazu, FUJIWARA, Hideo
Published in IEICE Transactions on Information and Systems (2008)

by HUSSIN, Fawnizu Azmadi, YONEDA, Tomokazu, ORAILOǦLU, Alex, FUJIWARA, Hideo
Published in IEICE Transactions on Information and Systems (2008)

by YU, Thomas Edison, YONEDA, Tomokazu, ZHAO, Danella, FUJIWARA, Hideo
Published in IEICE Transactions on Information and Systems (2008)

by YU, Thomas Edison, YONEDA, Tomokazu, CHAKRABARTY, Krishnendu, FUJIWARA, Hideo
Published in IEICE Transactions on Information and Systems (2008)

by Hossain, Fakir Sharif, Yoneda, Tomokazu, Inoue, Michiko, Orailoglu, Alex
Published in 2017 22nd IEEE European Test Symposium (ETS) (01.05.2017)

by INOUE, Michiko, YONEDA, Tomokazu
Published in The Journal of Reliability Engineering Association of Japan (01.12.2013)