by Yonamoto, Y.
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)

by Yokoyama, Toshihiko, Amemiya, Kenta, Yonamoto, Yoshiki, Matsumura, Daiju, Ohta, Toshiaki
Published in Journal of electron spectroscopy and related phenomena (01.08.2001)

by Yonamoto, Y.
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)

by Kinoshita, M., Sasago, Y., Minemura, H., Anzai, Y., Tai, M., Fujisaki, Y., Kusaba, S., Morimoto, T., Takahama, T., Mine, T., Shima, A., Yonamoto, Y., Kobayashi, T.
Published in 2012 Symposium on VLSI Technology (VLSIT) (01.06.2012)

by Yonamoto, Y, Futase, T, Akamatsu, N, Inaba, Y, Tanimoto, H
Published in 2010 International Symposium on Semiconductor Manufacturing (ISSM) (01.10.2010)

by Endo, Osamu, Kondoh, Hiroshi, Yonamoto, Yokishi, Yokoyama, Toshihiko, Ohta, Toshiaki
Published in Surface science (01.09.2000)

by Kitajima, Yoshinori, Amemiya, Kenta, Yonamoto, Yoshiki, Ohta, Toshiaki, Kikuchi, Takashi, Kosuge, Takashi, Toyoshima, Akio, Ito, Kenji
Published in Journal of synchrotron radiation (01.05.1998)

by Kitajima, Yoshinori, Yonamoto, Yoshiki, Amemiya, Kenta, Tsukabayashi, Hiroki, Ohta, Toshiaki, Ito, Kenji
Published in Journal of electron spectroscopy and related phenomena (01.06.1999)

by Yokoyama, T, Yonamoto, Y, Ohta, T, Ugawa, A
Published in Physical review. B, Condensed matter (01.09.1996)