Modulation Of HCI in I/O analog devices Through Process Specifications
Diouf, C., Federspiel, X., Bravaix, A., Doyen, C., Yon, V., Basset, L., Garros, X.
Published in 2023 IEEE International Integrated Reliability Workshop (IIRW) (08.10.2023)
Published in 2023 IEEE International Integrated Reliability Workshop (IIRW) (08.10.2023)
Get full text
Conference Proceeding
Insight Into HCI Reliability on I/O Nitrided Devices
Doyen, C., Yon, V., Garros, X., Basset, L., Frutuoso, T. Mota, Dagon, C., Diouf, C., Federspiel, X., Millon, V., Monsieur, F., Pribat, C., Roy, D.
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Get full text
Conference Proceeding
Traduction et étude de validation de la version française de l’échelle d’expérience temporelle du plaisir (EETP, Temporal Experience of Pleasure Scale [TEPS], Gard et al., 2006) : étude chez 125 étudiants et chez 162 sujets présentant un trouble psychiatrique
Loas, G., Monestes, J.-L., Ameller, A., Bubrovszky, M., Yon, V., Wallier, J., Berthoz, S., Corcos, M., Thomas, P., Gard, D.E.
Published in Annales médico psychologiques (01.11.2009)
Published in Annales médico psychologiques (01.11.2009)
Get full text
Journal Article
EPH123 Incorporating Social Determinants of Health Into Transmission Modeling of COVID-19 Vaccine in the US: A Scoping Review
Duong, K, Nguyen, DT, Kategaew, W, Liang, X, Khaing, W, Visnovsky, LD, Veettil, SK, McFarland, MM, Nelson, RE, Jones, B, Pavia, A, Coates, E, Khader, K, Love, J, Yon, GV, Zhang, Y, Willson, T, Dorsan, E, Toth, D, Jones, MM, Samore, M, Chaiyakunapruk, N
Published in Value in health (01.06.2024)
Published in Value in health (01.06.2024)
Get full text
Journal Article