Search Results - "Yohan FAUCILLON" :: K.UTB vyhledávací portál

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Method and a device for automatically determining adjustment values for operating parameters of a deposition line

by Sandre-Chardonnal, Etienne, Gajic, Vojislav, Faucillon, Yohan, Kauffmann, Thierry
Year of Publication 29.08.2023

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Method and device for locating the origin of a defect affecting a stack of thin layers deposited on a substrate

by Faucillon, Yohan, Kauffmann, Thierry, Nghiem, Bernard, Mathey, Gregoire
Year of Publication 07.06.2022

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A METHOD AND A DEVICE FOR AUTOMATICALLY DETERMINING ADJUSTMENT VALUES FOR OPERATING PARAMETERS OF A DEPOSITION LINE

by KAUFFMANN, Thierry, GAJIC, Vojislav, SANDREARDONNAL, Etienne, FAUCILLON, Yohan
Year of Publication 17.12.2020

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METHOD AND DEVICE FOR AUTOMATICALLY DETERMINING VALUES OF ADJUSTMENTS TO OPERATING PARAMETERS OF A DEPOSITION LINE

by KAUFFMANN, Thierry, GAJIC, Vojislav, SANDREARDONNAL, Etienne, FAUCILLON, Yohan
Year of Publication 14.10.2020

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METHOD AND DEVICE FOR LOCATING THE ORIGIN OF A DEFECT AFFECTING A STACK OF THIN LAYERS DEPOSITED ON A SUBSTRATE

by MATHEY, Gregoire, NGHIEM, Bernard, KAUFFMANN, Thierry, FAUCILLON, Yohan
Year of Publication 10.10.2019

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METHOD AND DEVICE FOR LOCATING THE ORIGIN OF A DEFECT AFFECTING A STACK OF THIN LAYERS DEPOSITED ON A SUBSTRATE

by MATHEY, Grégoire, NGHIEM, Bernard, KAUFFMANN, Thierry, FAUCILLON, Yohan
Year of Publication 01.05.2019

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PROCEDE ET DISPOSITIF DE DETERMINATION AUTOMATIQUE DE VALEURS D'AJUSTEMENT DE PARAMETRES DE FONCTIONNEMENT D'UNE LIGNE DE DEPOT

by GAJIC, VOJISLAV, FAUCILLON, YOHAN, KAUFFANN, THIERRY, SANDREARDONNAL, Etienne
Year of Publication 19.01.2024

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PROCEDE ET DISPOSITIF DE DETERMINATION AUTOMATIQUE DE VALEURS D'AJUSTEMENT DE PARAMETRES DE FONCTIONNEMENT D'UNE LIGNE DE DEPOT

by GAJIC, VOJISLAV, FAUCILLON, YOHAN, KAUFFANN, THIERRY
Year of Publication 14.06.2019

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METHOD AND DEVICE FOR AUTOMATICALLY DETERMINING VALUES OF ADJUSTMENTS TO OPERATING PARAMETERS OF A DEPOSITION LINE

by KAUFFMANN, Thierry, GAJIC, Vojislav, FAUCILLON, Yohan
Year of Publication 13.06.2019

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METHOD AND APPARATUS FOR LOCALIZING A DEFECT SOURCE OF A THIN-LAYER SYSTEM DEPOSITED ON A SUBSTRATE

by MATHEY, Gregoire, NGHIEM, Bernard, KAUFFMANN, Thierry, FAUCILLON, Yohan
Year of Publication 03.02.2021

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método e dispositivo de determinação automática de valores de ajuste dos parâmetros de funcionamento de uma linha de deposição

by VOJISLAV GAJIC, ETIENNE SANDREARDONNAL, YOHAN FAUCILLON, THIERRY KAUFFMANN
Year of Publication 17.11.2020

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METHOD AND DEVICE FOR AUTOMATICALLY DETERMINING VALUES OF ADJUSTMENTS TO OPERATING PARAMETERS OF A DEPOSITION LINE

by GAJIC Vojislav, SANDREARDONNAL Etienne, KAUFFMANN Thierry, FAUCILLON Yohan
Year of Publication 28.10.2020

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METHOD AND DEVICE FOR AUTOMATICALLY DETERMINING VALUES OF ADJUSTMENTS TO OPERATING PARAMETERS OF A DEPOSITION LINE

by KAUFFMANN THIERRY, SANDREARDONNAL ETIENNE, FAUCILLON YOHAN, GAJIC VOJISLAV
Year of Publication 15.09.2020

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A method and a device for automatically determining adjustment values for operating parameters of a deposition line

by KAUFFMANN, THIERRY, GAJIC, VOJISLAV, FAUCILLON, YOHAN, SANDREARDONNAL, ETIENNE
Year of Publication 16.09.2019

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PROCEDE ET DISPOSITIF DE LOCALISATION DE L'ORIGINE D'UN DEFAUT AFFECTANT UN EMPILEMENT DE COUCHES MINCES DEPOSEES SUR UN SUBSTRAT

by KAUFFMANN, THIERRY, NGHIEM, BERNARD, FAUCILLON, YOHAN, MATHEY, GREGOIRE
Year of Publication 26.07.2019

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METHOD AND DEVICE FOR LOCATING THE ORIGIN OF A DEFECT AFFECTING A STACK OF THIN LAYERS DEPOSITED ON A SUBSTRATE

by Grégoire MATHEY, Yohan FAUCILLON, Thierry KAUFFMANN, Bernard NGHIEM
Year of Publication 30.05.2019

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METHOD AND DEVICE FOR LOCATING THE ORIGIN OF A DEFECT AFFECTING A STACK OF THIN LAYERS DEPOSITED ON A SUBSTRATE

by KAUFFMANN THIERRY, MATHEY GREGOIRE, FAUCILLON YOHAN, NGHIEM BERNARD
Year of Publication 02.04.2019

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método e dispositivo para localizar a origem de um defeito que afeta uma pilha de camadas finas depositadas em um substrato

by YOHAN FAUCILLON, GRÉGOIRE MATHEY, THIERRY KAUFFMANN, BERNARD NGHIEM
Year of Publication 26.03.2019

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METHOD AND DEVICE FOR LOCATING THE ORIGIN OF A DEFECT AFFECTING A STACK OF THIN LAYERS DEPOSITED ON A SUBSTRATE

by KAUFFMANN, THIERRY, NGHIEM, BERNARD, FAUCILLON, YOHAN, MATHEY, GREGOIRE
Year of Publication 04.01.2018

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METHOD AND DEVICE FOR LOCATING THE ORIGIN OF A DEFECT AFFECTING A STACK OF THIN LAYERS DEPOSITED ON A SUBSTRATE

by MATHEY, Grégoire, NGHIEM, Bernard, KAUFFMANN, Thierry, FAUCILLON, Yohan
Year of Publication 04.01.2018

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