STI Effect on Flicker Noise in 0.13-μm RF NMOS
Chih-Yuan Chan, Jun-De Jin, Yu-Syuan Lin, Hsu, S.S.H., Ying-Zong Juane
Published in 2006 European Solid-State Device Research Conference (01.09.2006)
Published in 2006 European Solid-State Device Research Conference (01.09.2006)
Get full text
Conference Proceeding