High-Speed, Low-Storage Power and Thermal Predictions for ATPG Test Patterns
Liang, Zhe-Jia, Wu, Yu-Tsung, Yang, Yun-Feng, Li, James Chien-Mo, Chang, Norman, Kumar, Akhilesh, Li, Ying-Shiun
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
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Conference Proceeding
Interaction of RF DPI with ESD Protection Devices in EMS Testing of IC Chips
Tsukioka, Akihiro, Nagata, Makoto, Fujimoto, Daisuke, Miura, Noriyuki, Akimoto, Rieko, Egami, Takao, Niinomi, Kenji, Yuhara, Takesh, Hayashi, Sachio, Srinivasan, Karthik, Li, Ying-Shiun, Chang, Norman
Published in 2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) (01.08.2018)
Published in 2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) (01.08.2018)
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Conference Proceeding
Applying Machine Learning to Design for Reliability Coverage
Chang, Norman, Chuang, Wentze, Tsavatanalli, Ganesh Kumar, Geada, Joao, Zhuang, Hao, Ramachandran, Sankar, Raian, Rahul, Li, Ying-Shiun, Jia, Yaowei, Kaipanatu, Mathew, Mantena, Suresh Kumar, Shih, Ming-Chih, Yang, Anita, Jang, Roger
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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Conference Proceeding
ESD dynamic methodology for diagnosis and predictive simulation of HBM/CDM events
Ting-Sheng Ku, Jau-Wen Chen, Kokai, G., Chang, N., Shen Lin, Yu Liu, Ying-Shiun Li, Bo Hu
Published in Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012 (01.09.2012)
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Published in Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012 (01.09.2012)
Conference Proceeding
Vector-based Dynamic IR-drop Prediction Using Machine Learning
Chen, Jia-Xian, Liu, Shi-Tang, Wu, Yu-Tsung, Wu, Mu-Ting, Li, Chieo-Mo, Chang, Norman, Li, Ying-Shiun, Chuang, Wen-Tze
Published in 2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC) (17.01.2022)
Published in 2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC) (17.01.2022)
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Conference Proceeding
A full chip integrated power and substrate noise analysis framework for mixed-signal SoC design
Kosaka, D., Bando, Y., Yokomizo, G., Tsuboi, K., Ying Shiun Li, Shen Lin, Nagata, M.
Published in 2009 IEEE Custom Integrated Circuits Conference (01.09.2009)
Published in 2009 IEEE Custom Integrated Circuits Conference (01.09.2009)
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Conference Proceeding
Low-IR-Drop Test Pattern Regeneration Using A Fast Predictor
Liu, Shi-Tang, Chen, Jia-Xian, Wu, Yu-Tsung, Hsieh, Chao-Ho, Li, Chien-Mo, Chang, Norman, Li, Ying-Shiun, Chuang, Wen-Tze
Published in 2022 23rd International Symposium on Quality Electronic Design (ISQED) (06.04.2022)
Published in 2022 23rd International Symposium on Quality Electronic Design (ISQED) (06.04.2022)
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Conference Proceeding
Simulation techniques for EMC compliant design of automotive IC chips and modules
Tsukioka, Akihiro, Nagata, Makoto, Taniguchi, Kohki, Fujimoto, Daisuke, Akimoto, Rieko, Egami, Takao, Niinomi, Kenji, Yuhara, Takeshi, Hayashi, Sachio, Mathews, Rob, Srinivasan, Karthik, Ying-Shiun Li, Chang, Norman
Published in 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE (01.09.2017)
Published in 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE (01.09.2017)
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Conference Proceeding
Machine learning based generic violation waiver system with application on electromigration sign-off
Chang, Norman, Baranwal, Ajay, Zhuang, Hao, Shih, Ming-Chih, Rajan, Rahul, Jia, Yaowei, Liao, Hui-Lun, Li, Ying-Shiun, Ku, Ting, Lin, Rex
Published in 2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC) (01.01.2018)
Published in 2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC) (01.01.2018)
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Conference Proceeding
A Fast Side-Channel Leakage Simulation Technique Based on IC Chip Power Modeling
Tsukioka, Akihiro, Srinivasan, Karthik, Wan, Shan, Lin, Lang, Li, Ying-Shiun, Chang, Norman, Nagata, Makoto
Published in IEEE journal on electromagnetic compatibility practice and applications (01.12.2019)
Published in IEEE journal on electromagnetic compatibility practice and applications (01.12.2019)
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Journal Article
Thermal-Aware Test Frequency Optimization
Wang, Wei-Shen, Liang, Zhe-Jia, Li, James Chien-Mo, Chang, Norman, Kumar, Akhilesh, Li, Ying-Shiun
Published in 2024 IEEE International Test Conference in Asia (ITC-Asia) (18.08.2024)
Published in 2024 IEEE International Test Conference in Asia (ITC-Asia) (18.08.2024)
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Conference Proceeding
Photon Emission Modeling and Machine-Learning Assisted Pre-Silicon Optical Side-Channel Simulation
Li, Henian, Lin, Lang, Chang, Norman, Chowdhury, Sreeja, Mcguire, Dylan, Novakovic, Bozidar, Monta, Kazuki, Nagata, Makoto, Li, Ying-Shiun, S, Pramod M, Yeh, Piin-Chen, Jang, J.-S. Roger, Xi, Chengjie, Jin, Qiutong, Asadi, Navid, Tehranipoor, Mark
Published in 2024 IEEE International Symposium on Hardware Oriented Security and Trust (HOST) (06.05.2024)
Published in 2024 IEEE International Symposium on Hardware Oriented Security and Trust (HOST) (06.05.2024)
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Conference Proceeding
Efficient ESD Generator Modeling Using Reinforcement Learning
Kumar, Akhilesh, Yang, En-Cih, Shih, Ming-Chih, Li, Ying-Shiun, Chuang, Wen-Tze, Chang, Norman
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
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Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Conference Proceeding
Dynamic IR-Drop Prediction of At-Speed Two-Vector Tests Using Machine Learning
Wu, Yu-Tsung, Liang, Zhe-Jia, Hsieh, Chao-Ho, Yang, Yun-Feng, Lee, Yung-Jen, Li, James Chien-Mo, Chang, Norman, Li, Ying-Shiun, Lin, Lang
Published in 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) (22.04.2024)
Published in 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) (22.04.2024)
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Conference Proceeding
Systems and methods for machine learning based fast static thermal solver
Chang, Norman, Xia, Wenbo, Yang, En-Cih, Wen, Jimin, Pan, Hsiming, Zhu, Deqi, Li, Ying-Shiun, Kumar, Akhilesh, Chuang, Wen-Tze, Srinivasan, Karthik
Year of Publication 26.12.2023
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Year of Publication 26.12.2023
Patent
Methods and systems for predicting silicon density for a metal layer of semi-conductor chip via machine learning
Chang, Norman, Pathak, Jay Prakash, Yin, Lei, Zhang, Bolong, Yang, En Cih, Wen, Jimin, Shih, Ming-Chih, Li, Ying Shiun, Chen, Xi, Chuang, Wen-Tze, Kumar, Akhilesh
Year of Publication 24.10.2023
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Year of Publication 24.10.2023
Patent
SYSTEMS AND METHODS FOR MACHINE LEARNING BASED FAST STATIC THERMAL SOLVER
Chang, Norman, Xia, Wenbo, Yang, En-Cih, Wen, Jimin, Pan, Hsiming, Zhu, Deqi, Li, Ying-Shiun, Kumar, Akhilesh, Chuang, Wen-Tze, Srinivasan, Karthik
Year of Publication 01.09.2022
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Year of Publication 01.09.2022
Patent
Systems and methods for machine learning based fast static thermal solver
Chang, Norman, Xia, Wenbo, Yang, En-Cih, Wen, Jimin, Pan, Hsiming, Zhu, Deqi, Li, Ying-Shiun, Kumar, Akhilesh, Chuang, Wen-Tze, Srinivasan, Karthik
Year of Publication 21.06.2022
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Year of Publication 21.06.2022
Patent