Effects of Metal Electrode on the Electrical Performance of Amorphous In–Ga–Zn–O Thin Film Transistor
Yim, Jung-Ryoul, Jung, Sung-Yup, Yeon, Han-Wool, Kwon, Jang-Yoen, Lee, Young-Joo, Lee, Je-Hun, Joo, Young-Chang
Published in Japanese Journal of Applied Physics (01.01.2012)
Published in Japanese Journal of Applied Physics (01.01.2012)
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Journal Article
Erratum: “Effects of Metal Electrode on the Electrical Performance of Amorphous In–Ga–Zn–O Thin Film Transistor”
Yim, Jung-Ryoul, Jung, Sung-Yup, Yeon, Han-Wool, Kwon, Jang-Yoen, Lee, Young-Joo, Lee, Je-Hun, Joo, Young-Chang
Published in Japanese Journal of Applied Physics (01.02.2012)
Published in Japanese Journal of Applied Physics (01.02.2012)
Get full text
Journal Article
Erratum: "Effects of Metal Electrode on the Electrical Performance of Amorphous In--Ga--Zn--O Thin Film Transistor"
Yim, Jung-Ryoul, Jung, Sung-Yup, Yeon, Han-Wool, Kwon, Jang-Yoen, Lee, Young-Joo, Lee, Je-Hun, Joo, Young-Chang
Published in Japanese Journal of Applied Physics (01.02.2012)
Published in Japanese Journal of Applied Physics (01.02.2012)
Get full text
Journal Article
Effects of Metal Electrode on the Electrical Performance of Amorphous In–Ga–Zn–O Thin Film Transistor
Yim, Jung-Ryoul, Jung, Sung-Yup, Yeon, Han-Wool, Kwon, Jang-Yoen, Lee, Young-Joo, Lee, Je-Hun, Joo, Young-Chang
Published in Japanese Journal of Applied Physics (01.01.2012)
Published in Japanese Journal of Applied Physics (01.01.2012)
Get full text
Journal Article
Quantitative analysis of the size distributions and elements of the precipitates in Fe-3%Si alloy during secondary recrystallization annealing using HAADF imaging and XEDS
Yim, Jung-Ryoul, Min, Ah-Ri, Joo, Young-Chang
Published in Metals and materials international (01.02.2009)
Published in Metals and materials international (01.02.2009)
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Journal Article
TOUCH SENSOR
KIM, YONG SUK, JANG, IN HYUN, YIM, JUNG RYOUL, PARK, DOO HO, PARK, JANG HO
Year of Publication 20.06.2016
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Year of Publication 20.06.2016
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