Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline TRL Calibration Including Dynamic Accuracy
Luan, Peng, Wang, Yibang, Zhao, Wei, Liu, Chen, Liang, Faguo, Wu, Aihua, Du, Jing
Published in IEEE transactions on instrumentation and measurement (01.11.2020)
Published in IEEE transactions on instrumentation and measurement (01.11.2020)
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Journal Article
Calibration on the Fly-A Novel Two-Port S-Parameter Measurement Method for On-Wafer Leaky Systems
Wu, Aihua, Liu, Chen, Liang, Faguo, Zou, Xuefeng, Wang, Yibang, Luan, Peng, Li, Chong, Ridler, Nick
Published in IEEE transactions on microwave theory and techniques (01.08.2020)
Published in IEEE transactions on microwave theory and techniques (01.08.2020)
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Journal Article
Development of gallium-arsenide-based GCPW calibration kits for on-wafer measurements in the W-band
Wang, Yibang, Fu, Xingchang, Wu, Aihua, Liu, Chen, Luan, Peng, Liang, Faguo, Zhao, Wei, Shang, Xiaobang
Published in International journal of microwave and wireless technologies (01.06.2020)
Published in International journal of microwave and wireless technologies (01.06.2020)
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Journal Article
Electronic anisotropy in magic-angle twisted trilayer graphene
Zhang, Naiyuan J, Wang, Yibang, Watanabe, Kenji, Taniguchi, Takashi, Vafek, Oskar, Li, J. I. A
Year of Publication 02.11.2022
Year of Publication 02.11.2022
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Journal Article
Spontaneous momentum polarization and diodicity in Bernal bilayer graphene
Lin, Jiang-Xiazi, Wang, Yibang, Zhang, Naiyuan J, Watanabe, Kenji, Taniguchi, Takashi, Fu, Liang, Li, J. I. A
Year of Publication 08.02.2023
Year of Publication 08.02.2023
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Journal Article
Angle-resolved transport nonreciprocity and spontaneous symmetry breaking in twisted trilayer graphene
Zhang, Naiyuan James, Jiang-Xiazi Lin, Chichinadze, Dmitry V, Wang, Yibang, Watanabe, Kenji, Taniguchi, Takashi, Fu, Liang, Li, J I A
Published in arXiv.org (26.09.2023)
Published in arXiv.org (26.09.2023)
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Paper
Journal Article
A "Calibration on the Fly" Method for Millimeter-wave On-wafer Measurement
Li, Chong, Liu, Chen, Wu, Aihua, Liang, Faguo, Wang, Yibang, Luan, Peng
Published in 2020 13th UK-Europe-China Workshop on Millimetre-Waves and Terahertz Technologies (UCMMT) (29.08.2020)
Published in 2020 13th UK-Europe-China Workshop on Millimetre-Waves and Terahertz Technologies (UCMMT) (29.08.2020)
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Conference Proceeding
Method for determining parameters in on-wafer calibration piece model
Wu, Aihua, Liang, Faguo, Wang, Yibang, Liu, Chen, Sun, Jing, Li, Yanli, Luan, Peng, Huo, Ye
Year of Publication 30.04.2024
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Year of Publication 30.04.2024
Patent
Two-port on-wafer calibration piece circuit model and method for determining parameters
Wu, Aihua, Liang, Faguo, Wang, Yibang, Liu, Chen, Sun, Jing, Li, Yanli, Luan, Peng, Huo, Ye
Year of Publication 22.08.2023
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Year of Publication 22.08.2023
Patent
Electronic anisotropy in magic-angle twisted trilayer graphene
Zhang, Naiyuan J, Wang, Yibang, Watanabe, Kenji, Taniguchi, Takashi, Vafek, Oskar, Li, J I A
Published in arXiv.org (02.11.2022)
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Published in arXiv.org (02.11.2022)
Paper
Calibration method and terminal equipment of terahertz frequency band on-wafer S parameter
Wu, Aihua, Liang, Faguo, Wang, Yibang, Liu, Chen, Sun, Jing, Li, Yanli, Luan, Peng, Huo, Ye
Year of Publication 12.07.2022
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Year of Publication 12.07.2022
Patent
Two-Port On-Wafer Calibration Piece Circuit Model and Method for Determining Parameters
Wu, Aihua, Liang, Faguo, Wang, Yibang, Liu, Chen, Sun, Jing, Li, Yanli, Luan, Peng, Huo, Ye
Year of Publication 07.04.2022
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Year of Publication 07.04.2022
Patent
Method for Determining Parameters in On-Wafer Calibration Piece Model
Wu, Aihua, Liang, Faguo, Wang, Yibang, Liu, Chen, Sun, Jing, Li, Yanli, Luan, Peng, Huo, Ye
Year of Publication 31.03.2022
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Year of Publication 31.03.2022
Patent
Calibration method, system and device of on-wafer s parameter of vector network analyzer
Wu, Aihua, Liang, Faguo, Hu, Zhifu, Wang, Yibang, Liu, Chen, Cao, Jian, Zou, Xuefeng, Huo, Ye
Year of Publication 15.03.2022
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Year of Publication 15.03.2022
Patent