by Gruszecki, A. A., Prasad, R., Suryavanshi, S. V., Yeric, G., Young, C. D.
Published in 2023 35th International Conference on Microelectronic Test Structure (ICMTS) (27.03.2023)

by Gruszecki, A. A., Fernandez-Izquierdo, L., Suryavanshi, S. V., Yeric, G., Quevedo-Lopez, M., Young, C. D.
Published in 2023 IEEE International Integrated Reliability Workshop (IIRW) (08.10.2023)

by Karthikeyan, M., Fox, S., Cote, W., Yeric, G., Hall, M., Garcia, J., Mitchell, B., Wolf, E., Agarwal, S.
Published in IEEE transactions on semiconductor manufacturing (01.05.2008)

by Sinha, Saurabh, Yeric, Greg, Chandra, Vikas, Cline, Brian, Cao, Yu
Published in DAC Design Automation Conference 2012 (03.06.2012)

by Shin, H., Yeric, G.M., Tasch, A.F., Maziar, C.M.
Published in Solid-state electronics (01.06.1991)

by Sinha, S., Shifren, L., Chandra, V., Cline, B., Yeric, G., Aitken, R., Cheng, B., Brown, A.R., Riddet, C., Alexandar, C., Millar, C., Asenov, A.
Published in Sixteenth International Symposium on Quality Electronic Design (01.03.2015)

by Yeric, Greg
Published in IEEE transactions on semiconductor manufacturing (01.05.2008)

by Agostinelli, V.M., Yeric, G.M., Tasch, A.F.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.03.1993)

by Bashir, R., Kim, S., Qadri, N., Jin, D., Neudeck, G.W., Denton, J.P., Yeric, G., Wu, K., Tasch, A.
Published in IEEE electron device letters (01.09.1995)

by Yue, C., Agostinelli, V.M., Yeric, G.M., Tasch, A.F.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.10.1993)

by Aitken, R, Yeric, G, Flynn, D
Published in 2011 Design, Automation & Test in Europe (01.03.2011)

by Adamu-Lema, F., Amoroso, S. M., Wang, X., Cheng, B., Shifren, L., Aitken, R., Sinha, S., Yeric, G., Asenov, A.
Published in 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2014)

by Yeric, G., Cohen, E., Garcia, J., Davis, K., Salem, E., Green, G.
Published in IEEE design & test of computers (01.05.2005)

by DeBord, J.R.D., Grice, T., Garcia, R., Yeric, G., Cohen, E., Sutandi, A., Garcia, J., Green, G.
Published in Proceedings of the IEEE 2005 International Interconnect Technology Conference, 2005 (2005)

by Yeric, G.M., Tasch, A.F., Banerjee, S.K.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.10.1990)

by Yeric, G.
Published in 2011 International Electron Devices Meeting (01.12.2011)

by Karthikeyan, M., Gasasira, A., Fox, S., Yeric, G., Hall, M.
Published in 2007 IEEE International Conference on Microelectronic Test Structures (01.03.2007)

by Karthikeyan, M., Fox, S., Cote, W., Yeric, G., Hall, M., Garcia, J., Mitchell, B., Wolf, E., Agarwal, S.
Published in 2006 IEEE International Conference on Microelectronic Test Structures (2006)

by Montanari, D., Deshazo, D., Yeric, G.
Published in ICECS 2001. 8th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.01EX483) (2001)

by Villemain, Michel, Yeric, Greg
Published in Solid state technology (01.07.2005)