by Ki-Duk Kim, San-Ho Byun, Yoon-Kyung Choi, Jong-Hak Baek, Hwa-Hyun Cho, Jong-Kang Park, Hae-Yong Ahn, Chang-Ju Lee, Min-Soo Cho, Joo-Hyeon Lee, Sang-Woo Kim, Hyung-Dal Kwon, Yong-Yeob Choi, Hosuk Na, Junchul Park, Yeon-Joong Shin, Kyungsuk Jang, Gyoocheol Hwang, Myunghee Lee
Published in 2012 IEEE International Solid-State Circuits Conference (01.02.2012)

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