Electrical characterization of composition modulated In(1-x)Sb(x) nanowire field effect transistors by scanning gate microscopy
Martinez-Morales, A A, Penchev, M, Zhong, J, Jing, X, Singh, K V, Yengel, E, Khan, M I, Ozkan, C S, Ozkan, M
Published in Journal of nanoscience and nanotechnology (01.10.2010)
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Published in Journal of nanoscience and nanotechnology (01.10.2010)
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