300-mm full-factory Simulations for 90- and 65-nm IC manufacturing
Pillai, D.D., Bass, E.L., Dempsey, J.C., Yellig, E.J.
Published in IEEE transactions on semiconductor manufacturing (01.08.2004)
Published in IEEE transactions on semiconductor manufacturing (01.08.2004)
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Conference Proceeding
Robust deterministic scheduling in stochastic environments: The method of capacity hedge points
Yellig, E. J., Mackulak, G.T.
Published in International journal of production research (01.02.1997)
Published in International journal of production research (01.02.1997)
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Journal Article