Highly uniform low-power resistive memory using nitrogen-doped tantalum pentoxide
Cheng, C.H., Chen, P.C., Wu, Y.H., Wu, M.J., Yeh, F.S., Chin, Albert
Published in Solid-state electronics (01.07.2012)
Published in Solid-state electronics (01.07.2012)
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Journal Article
Optimal design of sewer network by tabu search and simulated annealing
Yeh, S.-F, Chang, Y.-J, Lin, M.-D
Published in 2013 IEEE International Conference on Industrial Engineering and Engineering Management (01.12.2013)
Published in 2013 IEEE International Conference on Industrial Engineering and Engineering Management (01.12.2013)
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Conference Proceeding
Low-Threshold-Voltage TaN/LaTiO n-MOSFETs With Small EOT
Lin, S.H., Yeh, F.S., Cheng, C.H., Chin, A., Chen, W.B.
Published in IEEE electron device letters (01.09.2009)
Published in IEEE electron device letters (01.09.2009)
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Journal Article
Bipolar switching characteristics of low-power Geo resistive memory
Cheng, C.H., Chen, P.C., Liu, S.L., Wu, T.L., Hsu, H.H., Chin, Albert, Yeh, F.S.
Published in Solid-state electronics (01.08.2011)
Published in Solid-state electronics (01.08.2011)
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Journal Article
Improved High Temperature Retention for Charge-Trapping Memory by Using Double Quantum Barriers
Yang, H.J., Chin, A., Lin, S.H., Yeh, F.S., McAlister, S.P.
Published in IEEE electron device letters (01.04.2008)
Published in IEEE electron device letters (01.04.2008)
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Journal Article
Low-Threshold-Voltage TaN/Ir/LaTiO p-MOSFETs Incorporating Low-Temperature-Formed Shallow Junctions
Lin, S.H., Chen, W.B., Cheng, C.H., Yeh, F.S., Chin, A.
Published in IEEE electron device letters (01.06.2009)
Published in IEEE electron device letters (01.06.2009)
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Journal Article
Long-Endurance Nanocrystal TiO2 Resistive Memory Using a TaON Buffer Layer
CHENG, C. H, CHEN, P. C, WU, Y. H, YEH, F. S, CHIN, Albert
Published in IEEE electron device letters (01.12.2011)
Published in IEEE electron device letters (01.12.2011)
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Journal Article
Finite-element method-method of lines approach for the analysis of three-dimensional electromagnetic cavities
CHEN, H.-H, YEH, S.-F, CHOU, Y.-H, HSIEH, R.-C
Published in IET microwaves, antennas & propagation (01.06.2007)
Published in IET microwaves, antennas & propagation (01.06.2007)
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Journal Article
High-Density and Low-Leakage-Current MIM Capacitor Using Stacked TiO2/ZrO2 Insulators
LIN, S. H, CHIANG, K. C, CHIN, Albert, YEH, F. S
Published in IEEE electron device letters (01.07.2009)
Published in IEEE electron device letters (01.07.2009)
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Journal Article
Sub-micro watt resistive memories using nano-crystallized aluminum oxynitride dielectric
Chen, N. H., Zheng, Z. W., Cheng, C. H., Yeh, F. S.
Published in Applied physics. A, Materials science & processing (01.08.2014)
Published in Applied physics. A, Materials science & processing (01.08.2014)
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Journal Article
High Density and Low Leakage Current in TiO2 MIM Capacitors Processed at 300 °C
CHENG, C. H, LIN, S. H, CHIN, Albert, JHOU, K. Y, CHEN, W. J, CHOU, C. P, YEH, F. S, HU, J, HWANG, M, ARIKADO, T, MCALISTER, S. P
Published in IEEE electron device letters (01.08.2008)
Published in IEEE electron device letters (01.08.2008)
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Journal Article