by Yao, Liang-Zi, Crisostomo, Christian P, Yeh, Chun-Chen, Lai, Shu-Ming, Huang, Zhi-Quan, Hsu, Chia-Hsiu, Chuang, Feng-Chuan, Lin, Hsin, Bansil, Arun
Published in Scientific reports (05.11.2015)

by Joshi, Rajiv V., Keunwoo Kim, Kanj, Rouwaida, Bhoj, Ajay N., Ziegler, Matthew M., Oldiges, Phil, Kerber, Pranita, Wong, Robert, Hook, Terence, Saroop, Sudesh, Radens, Carl, Chun-Chen Yeh
Published in IEEE transactions on very large scale integration (VLSI) systems (01.03.2015)

by Wang, Jong-Yi, Liang, Yia-Wen, Yeh, Chun-Chen, Liu, Chiu-Shong, Wang, Chen-Yu
Published in BMJ open (21.02.2018)

by Maitra, K, Khakifirooz, A, Kulkarni, P, Basker, V S, Faltermeier, J, Jagannathan, H, Adhikari, H, Chun-Chen Yeh, Klymko, N R, Saenger, K, Standaert, T, Miller, R J, Doris, B, Paruchuri, V K, McHerron, D, O'Neil, J, Leobundung, E, Huiming Bu
Published in IEEE electron device letters (01.06.2011)

by Liu, Shih-Lun, Chen, Chun-Yeh, Chen, Yuh-Shuen
Published in Journal of bioscience and bioengineering (01.03.2022)

by Wu, Mu-Chen, Liu, Shih-Lun, Liou, Bo-Kang, Chen, Chun-Yeh, Chen, Yuh-Shuen
Published in Standards (28.08.2023)

by Paul, Abhijeet, Chun-chen Yeh, Standaert, Theodorus, Johnson, Jeffrey B., Bryant, Andres, Tripathi, Neeraj, Tsutsui, Gen, Yamashita, Tenko, Basker, Veeraraghvan S., Faltermeier, Johnathan, Jin Cho, Huiming Bu, Khare, Mukesh
Published in 2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) (2013)

by Chun-Chen Yeh, Holtzclaw, K., Ramaswamy, N., Gowda, S., Brewer, R., Graettinger, T., Kyu Min, Mouli, C., Parat, K., Ma, T.P.
Published in IEEE electron device letters (01.07.2008)

by Miaomiao Wang, Kulkarni, Pranita, Kangguo Cheng, Khakifirooz, Ali, Basker, V S, Jagannathan, Hemanth, Chun-Chen Yeh, Paruchuri, Vamsi, Doris, Bruce, Huiming Bu, Chung-Hsun Lin, Stathis, James H, Maitra, Kingsuk, Oldiges, Philip J
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)

by Pei-Jer Tzeng, Chang, Y.-Y.I., Chun-Chen Yeh, Chih-Chiang Chen, Chien-Hung Liu, Mu-Yi Liu, Bone-Fong Wu, Kuei-Shu Chang-Liao
Published in IEEE transactions on electron devices (01.07.2002)

by Soon-Cheon Seo, Chih-Chao Yang, Chun-Chen Yeh, Haran, B., Horak, D., Fan, S., Koburger, C., Canaperi, D., Papa Rao, S.S., Monsieur, F., Knorr, A., Kerber, A., Chao-Kun Hu, Kelly, J., Tuan Vo, Cummings, J., Smalleya, M., Petrillo, K., Mehta, S., Schmitz, S., Levin, T., Dae-Guy Park, Stathis, J.H., Spooner, T., Paruchuri, V., Wynne, J., Edelstein, D., McHerron, D., Doris, B.
Published in 2009 IEEE International Interconnect Technology Conference (01.06.2009)

by Yeh, Chun-Chen, Tsai, Chia-Hsien, Wu, Guan-Lin, Hsu, Tzu-Hsuan, Li, Ming-Huang
Published in 2023 IEEE 36th International Conference on Micro Electro Mechanical Systems (MEMS) (15.01.2023)

by Kim, Youngseok, Kim, Seyoung, Chun-chen, Yeh, Narayanan, Vijay, Choi, Jungwook
Published in arXiv.org (11.02.2020)

by Yeh, Chun-Chen, Culurciello, Eugenio
Published in 2007 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2007)

by Hsu, Tzu-Hsuan, Lee, Zhi-Qiang, Wu, Guan-Lin, Yeh, Chun-Chen, Tsai, Chia-Hsien, Li, Ming-Huang
Published in IEEE transactions on ultrasonics, ferroelectrics, and frequency control (22.08.2024)

by Hsu, Tzu-Hsuan, Lee, Zhi-Qiang, Wu, Guan-Lin, Yeh, Chun-Chen, Tsai, Chia-Hsien, Li, Ming-Huang
Published in IEEE transactions on ultrasonics, ferroelectrics, and frequency control (22.08.2024)

by Lin, Ta‐Chen, Chen, Bang‐Yuan, Chen, Chun‐Yeh, Chen, Yuh‐Shuen, Wu, Haibo
Published in Journal of food process engineering (01.11.2019)

by Yao, Liang-Zi, Crisostomo, Christian P., Yeh, Chun-Chen, Lai, Shu-Ming, Huang, Zhi-Quan, Hsu, Chia-Hsiu, Chuang, Feng-Chuan, Lin, Hsin, Bansil, Arun
Published in Scientific reports (05.11.2015)

by Yao, Liang-Zi, Crisostomo, Christian P., Yeh, Chun-Chen, Lai, Shu-Ming, Huang, Zhi-Quan, Hsu, Chia-Hsiu, Chuang, Feng-Chuan, Lin, Hsin, Bansil, Arun
Published in Scientific reports (05.11.2015)

by Ramaswamy, N., Chun-Chen Yeh, Krishnamohan, T., Gowda, S., Rocklein, N., Brewer, R., Graettinger, T., Min, K.
Published in 2009 IEEE Workshop on Microelectronics and Electron Devices (01.04.2009)