Investigation and Modeling of Hot Carrier Effects on Performance of 45- and 55-nm NMOSFETs With RF Automatic Measurement
Mao-Chyuan Tang, Yean-Kuen Fang, Wen-Shiang Liao, Chen, D.C., Chune-Sin Yeh, Shan-Chieh Chien
Published in IEEE transactions on electron devices (01.06.2008)
Published in IEEE transactions on electron devices (01.06.2008)
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Journal Article
Impact of Uniaxial Strain on Random Telegraph Noise in High- k /Metal Gate pMOSFETs
Po-Chin Huang, Chen, Jone F., Tsai, Shih Chang, San Lein Wu, Kai-Shiang Tsai, Tsung Hsien Kao, Yean-Kuen Fang, Chien-Ming Lai, Chia-Wei Hsu, Yi-Wen Chen, Cheng, Osbert
Published in IEEE transactions on electron devices (01.03.2015)
Published in IEEE transactions on electron devices (01.03.2015)
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Journal Article
N-SiCN/P-Silicon Heterojunction With Porous Silicon Buffer Layer for Low-Cost and High-Temperature Ultraviolet (UV) Detecting Applications
Chiang, Yen-Ting, Fang, Yean-Kuen, Chou, Tse-Heng, Lin, Cheng-I, Juang, Feng-Renn, Kuo, Ta-Wei, Wu, Kuen-Hsien, Ho, Mingtsu, Shie, Jin-Shu
Published in IEEE sensors journal (01.07.2009)
Published in IEEE sensors journal (01.07.2009)
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Journal Article
The low temperature polysilicon (LTPS) thin film MOS Schottky diode on glass substrate for low cost and high performance CO sensing applications
Juang, Feng-Renn, Fang, Yean-Kuen, Chiang, Yen-Ting, Chou, Tse-Heng, Lin, Cheng-I., Lin, Cheng-Wei
Published in Sensors and actuators. B, Chemical (10.08.2011)
Published in Sensors and actuators. B, Chemical (10.08.2011)
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Journal Article
Comparative Study of Carbon Monoxide Gas Sensing Mechanism for the LTPS MOS Schottky Diodes With Various Metal Oxides
Juang, Feng-Renn, Fang, Yean-Kuen, Chiang, Yen-Ting, Chou, Tse-Heng, Lin, Cheng-I, Lin, Cheng-Wei, Liou, Yan-Wei
Published in IEEE sensors journal (01.05.2011)
Published in IEEE sensors journal (01.05.2011)
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Journal Article
A Low-Flicker Noise Gate-Controlled Lateral-Vertical Bipolar Junction Transistor Array With 55-nm CMOS Technology
Shuo-Mao Chen, Yean-Kuen Fang, Feng-Renn Juang, Chia-Chung Chen, Liu, Sally, Chin-Wei Kuo, Chih-Ping Chao, Hua-Chou Tseng
Published in IEEE transactions on electron devices (01.10.2011)
Published in IEEE transactions on electron devices (01.10.2011)
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Journal Article
A Novel Method to Improve Laser Anneal Worsened Negative Bias Temperature Instability in 40-nm CMOS Technology
Ming-Shing Chen, Yean-Kuen Fang, Feng-Renn Juang, Yen-Ting Chiang, Cheng-I Lin, Tung-Hsing Lee, Chou, Sam, Ning, Judy
Published in IEEE transactions on electron devices (01.03.2011)
Published in IEEE transactions on electron devices (01.03.2011)
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Journal Article
Effect of Finger Pitch on the Driving Ability of a 40-nm MOSFET With Contact Etch Stop Layer Strain in Multifinger Gated Structure
Chen, Ming-Shing, Fang, Yean-Kuen, Juang, Feng-Renn, Chiang, Yen-Ting, Lin, Cheng-I, Lee, Tung-Hsing, Tseng, Chih-Yu, Chou, Sam, Chen, Chii-Wen
Published in IEEE transactions on electron devices (01.06.2010)
Published in IEEE transactions on electron devices (01.06.2010)
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Journal Article
Effect of extrinsic impedance and parasitic capacitance on figure of merit of RF MOSFET
Wen-Kuan Yeh, Chao-Ching Ku, Shuo-Mao Chen, Yean-Kuen Fang, Chao, C.P.
Published in IEEE transactions on electron devices (01.09.2005)
Published in IEEE transactions on electron devices (01.09.2005)
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Journal Article
Substrate noise-coupling characterization and efficient suppression in CMOS technology
Yeh, Wen-Kuan, Chen, Shuo-Mao, Fang, Yean-Kuen
Published in IEEE transactions on electron devices (01.05.2004)
Published in IEEE transactions on electron devices (01.05.2004)
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Journal Article
The hetero-epitaxial SiCN/Si MSM photodetector for high-temperature deep-UV detecting applications
Chang, Wen-Rong, Fang, Yean-Kuen, Ting, Shyh-Fann, Tsair, Yong-Shiuan, Chang, Cheng-Nan, Lin, Chun-Yu, Chen, Shih-Fang
Published in IEEE electron device letters (01.09.2003)
Published in IEEE electron device letters (01.09.2003)
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Journal Article
GaN on Silicon Substrate With Various SiC Buffer Layer for UV Detecting Applications
Chiang, Yen-Ting, Fang, Yean-Kuen, Chou, Tse-Heng, Juang, Feng-Renn, Hsu, Kai-Chun, Wei, Tzu-Chieh, Lin, Cheng-I, Chen, Chii-Wen, Liang, Chi-Ying
Published in IEEE sensors journal (01.08.2010)
Published in IEEE sensors journal (01.08.2010)
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Journal Article
Investigation of Bulk Traps Enhanced Gate-Induced Leakage Current in Hf-Based MOSFETs
Liao, J.C., Yean-Kuen Fang, Hou, Y.T., Tseng, W.H., Hsu, P.F., Lin, K.C., Huang, K.T., Lee, T.L., Liang, M.S.
Published in IEEE electron device letters (01.05.2008)
Published in IEEE electron device letters (01.05.2008)
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Journal Article
Investigation of Low-Frequency Noise Characterization of 28-nm High-k pMOSFET with Embedded SiGe Source/Drain
Lo, Kun-Yuan, Cheng, Osbert, Fang, Yean-Kuen, Yang, Chih-Wei, Kao, Tsung-Hsien, Tsai, Kai-Shiang, Huang, Po Chin, Wang, Bo-Chin, Chen, Jone-Fang, Wu, San-Lein, Tsai, Shih-Chang, Chen, Cheng-Guo
Published in Journal of nanomaterials (01.01.2014)
Published in Journal of nanomaterials (01.01.2014)
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