by Sample, A.P., Yeager, D.J., Powledge, P.S., Mamishev, A.V., Smith, J.R.
Published in IEEE transactions on instrumentation and measurement (01.11.2008)

by Yeager, D.J., Holleman, J., Prasad, R., Smith, J.R., Otis, B.P.
Published in IEEE transactions on biomedical circuits and systems (01.12.2009)

by Sample, A.P., Yeager, D.J., Smith, J.R.
Published in 2009 IEEE International Conference on RFID (01.04.2009)

by Yeager, D.J., Powledge, P.S., Prasad, R., Wetherall, D., Smith, J.R.
Published in 2008 IEEE International Conference on RFID (01.04.2008)

by Sample, A.P., Yeager, D.J., Smith, J.R., Powledge, P.S., Mamishev, A.V.
Published in 2006 International Conference on Actual Problems of Electron Devices Engineering (01.09.2006)

by Yeager, D.J., Sample, A.P., Smith, J.R., Powledge, P.S., Mamishev, A.V.
Published in 2006 International Conference on Actual Problems of Electron Devices Engineering (01.09.2006)