Experimental demonstration of performance enhancement on highly-scaled bulk nFinFETs with novel carrier transport engineering
Ming-Hung Han, Yun-Ju Sun, Ming-Huei Lin, Yamamoto, Tomonari, Shyh-Horng Yang
Published in 2015 International Symposium on VLSI Technology, Systems and Applications (01.04.2015)
Published in 2015 International Symposium on VLSI Technology, Systems and Applications (01.04.2015)
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Conference Proceeding
Experimental demonstration of performance improvement with a strain boost technique tailored for 3-Dimensional structure on nano-scaled bulk pFinFETs
Ta-Chun Lin, Yun-Ju Sun, Ming-Huei Lin, Yamamoto, Tomonari, Shyh-Horng Yang
Published in 2016 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) (01.04.2016)
Published in 2016 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) (01.04.2016)
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Conference Proceeding
Monte Carlo simulation of arsenic ion implantation in (100) single-crystal silicon
Shyh-Horng Yang, Morris, S.J., Shiyang Tian, Parab, K.B., Tasch, A.F.
Published in IEEE transactions on semiconductor manufacturing (01.02.1996)
Published in IEEE transactions on semiconductor manufacturing (01.02.1996)
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Journal Article
An accurate and computationally efficient semi-empirical model for arsenic implants into single-crystal (100) silicon
SHYH-HORNG YANG, MORRIS, S. J, LIM, D. L, TASCH, A. F, SIMONTON, R. B, KAMENITSA, D, MAGEE, C, LUX, G
Published in Journal of electronic materials (01.08.1994)
Published in Journal of electronic materials (01.08.1994)
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Journal Article
Tackling Fundamental Challenges of Carrier Transport and Device Variability in Advanced SinFinFETs for 7nm Node and Beyond
Lin, Ming-Huei, Chang, Vincent S., Lu, Jen-Hsiang, Wang, Shu-Hui, Yang, Shyh-Horng
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)
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Conference Proceeding
I/O device optimization techniques tailored for highly-scaled FinFET technology
Ming-Huei Lin, Chung-An Hu, Chia-Cheng Chen, Tien-Shun Chang, Yun-Ju Sun, Hou-Yu Chen, Chang, Vincent S., Shyh-Horng Yang
Published in 2017 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) (01.04.2017)
Published in 2017 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) (01.04.2017)
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Conference Proceeding
Ion beam studies of events typical of soft errors in semiconductor memories
Aton, Tom, Seitchik, Jerold, Yang, Shyh-Horng, Shichijo, Hisashi
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.07.1997)
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.07.1997)
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Journal Article
An accurate and efficient model for boron implants through thin oxide layers into single-crystal silicon
Morris, S.J., Shyh-Horng Yang, Lim, D.H., Changhae Park, Klein, K.M., Manassian, M., Tasch, A.F.
Published in IEEE transactions on semiconductor manufacturing (01.11.1995)
Published in IEEE transactions on semiconductor manufacturing (01.11.1995)
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Journal Article
Characterization of Zener-tunneling drain leakage current in high-dose halo implants
Chang-Hoon Choi, Shyh-Horng Yang, Pollack, G., Ekbote, S., Chidambaram, P.R., Johnson, S., Machala, C., Dutton, R.W.
Published in International Conference on Simulation of Semiconductor Processes and Devices, 2003. SISPAD 2003 (2003)
Published in International Conference on Simulation of Semiconductor Processes and Devices, 2003. SISPAD 2003 (2003)
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