Charge Migration Analysis of 3D SONOS NAND Flash Memory Using Test Pattern
Jeong, Jun-Kyo, Sung, Jae-Young, Yang, Hee-Hoon, Lee, Hi-Deok, Lee, Ga-Won
Published in Journal of semiconductor technology and science (01.04.2020)
Published in Journal of semiconductor technology and science (01.04.2020)
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