Analysis of SOI CMOS Microprocessor's SEE Sensitivity: Correlation of the Results Obtained by Different Test Methods
Gorbunov, Maxim S., Vasilegin, Boris V., Antonov, Andrey A., Osipenko, Pavel N., Zebrev, Gennady I., Anashin, Vasily S., Emeliyanov, Vladimir V., Ozerov, Alexander I., Useinov, Rustem G., Chumakov, Alexander I., Pechenkin, Alexander A., Yanenko, Andrey V.
Published in IEEE transactions on nuclear science (01.08.2012)
Published in IEEE transactions on nuclear science (01.08.2012)
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Journal Article
Hardness assurance levels and requirements for single event effects testing of integrated circuits
Chumakov, Alexander I., Sogoyan, Armen V., Smolin, Anatoly A., Ahmetov, Alexey O., Bobrovsky, Dmitry V., Boychenko, Dmitry V., Ryasnoy, Nikolai V., Chumakov, Konstantin A., Churilin, Evgeny V., Gerasimov, Vladimir F., Khaustov, Vitaly V., Sashov, Alexander A., Ulanova, Anastasia V., Yanenko, Andrey V.
Published in Bezopasnostʹ informat͡s︡ionnykh tekhnologiĭ (01.03.2020)
Published in Bezopasnostʹ informat͡s︡ionnykh tekhnologiĭ (01.03.2020)
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Journal Article
Method of SEU-Hardness Assurance for SRAM with Error Correction Using Focused Laser Sources
Boruzdina, Anna B., Pechenkin, Alexander A., Yashanin, Igor B., Ulanova, Anastasiya V., Yanenko, Andrey V., Chumakov, Alexander I.
Published in 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2015)
Published in 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2015)
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Conference Proceeding
Experimental Investigation of SELs in SiT8003 MEMS-Oscillators
Tararaksin, Alexander S., Kessarinskiy, Leonid N., Pechenkin, Alexander A., Demidova, Alexandra V., Yanenko, Andrey V., Boychenko, Dmitry V., Nikiforov, Alexander Y.
Published in 2015 IEEE Radiation Effects Data Workshop (REDW) (01.07.2015)
Published in 2015 IEEE Radiation Effects Data Workshop (REDW) (01.07.2015)
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Conference Proceeding
Different Chips at Identical Marking on the Example of OP1177
Demidova, Alexandra V., Pechenkin, Alexander A., Borisov, Alexey Y., Kessarinskiy, Leonid N., Yanenko, Andrey V., Boychenko, Dmitry V., Nikiforov, Alexander Y.
Published in 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2015)
Published in 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2015)
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Conference Proceeding
Fault-Tolerant SOI Microprocessor for Space Applications
Osipenko, Pavel N., Antonov, Andrey A., Klishin, Alexander V., Vasilegin, Boris V., Gorbunov, Maxim S., Dolotov, Pavel S., Zebrev, Gennady I., Anashin, Vasily S., Emeliyanov, Vladimir V., Ozerov, Alexander I., Chumakov, Alexander I., Yanenko, Andrey V., Vasiliev, Alexey L.
Published in IEEE transactions on nuclear science (01.08.2013)
Published in IEEE transactions on nuclear science (01.08.2013)
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Journal Article
Memory chips and units radiation tolerance dependence on supply voltage during irradiation and test
Petrov, Andrey, Nikiforov, Alexander, Boruzdina, Anna, Ulanova, Anastasia, Yanenko, Andrey
Published in Facta universitatis. Series Electronics and energetics (01.03.2018)
Published in Facta universitatis. Series Electronics and energetics (01.03.2018)
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Journal Article
Femtosecond Laser Simulation Facility for SEE IC Testing
Egorov, Andrey N., Chumakov, Alexander I., Mavritskiy, Oleg B., Pechenkin, Alexander A., Savchenkov, Dmitriy V., Telets, Vitaliy A., Yanenko, Andrey V.
Published in 2014 IEEE Radiation Effects Data Workshop (REDW) (01.07.2014)
Published in 2014 IEEE Radiation Effects Data Workshop (REDW) (01.07.2014)
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Conference Proceeding
"PICO-4" Single Event Effects Evaluation and Testing Facility Based on Wavelength Tunable Picosecond Laser
Egorov, A. N., Chumakov, A. I., Mavritskiy, O. B., Pechenkin, A. A., Koltsov, D., Yanenko, A. V.
Published in 2012 IEEE Radiation Effects Data Workshop (01.07.2012)
Published in 2012 IEEE Radiation Effects Data Workshop (01.07.2012)
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Conference Proceeding
Influence of FRAM operational mode on its SEE susceptibility
Boruzdina, Anna B., Ulanova, Anastasia V., Orlov, Andrey A., Pechenkin, Alexander A., Yanenko, Andrey V., Nikiforov, Alexander Y.
Published in 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2016)
Published in 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2016)
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Conference Proceeding
Microdose effects in SRAM cells under heavy ion irradiation
Boruzdina, Anna B., Yanenko, Andrey V., Ulanova, Anastasia V., Chumakov, Alexander I., Bobrovskiy, Dmitriy V., Uzhegov, Vyacheslav M.
Published in 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.10.2017)
Published in 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.10.2017)
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Conference Proceeding
SEL and cell failures in MRAM under ion and focused laser irradiation
Pechenkin, Alexander A., Boruzdina, Anna B., Yanenko, Andrey V., Protasov, Dmitry. E., Shvetsov-Shilovskiy, Ivan I., Sangalov, Anton A.
Published in 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.10.2017)
Published in 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.10.2017)
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Conference Proceeding
Study of SEL and SEU in SRAM using different laser techniques
Savchenkov, Dmitry V., Chumakov, Alexander I., Petrov, Andrey G., Pechenkin, Alexander A., Egorov, Andrey N., Mavritskiy, Oleg B., Yanenko, Andrey V.
Published in 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2013)
Published in 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2013)
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Conference Proceeding
Compendium of SEE comparative results under ion and laser irradiation
Chumakov, Alexander I., Pechenkin, Alexander A., Savchenkov, Dmitry V., Yanenko, Andrey V., Kessarinskiy, Leonid N., Nekrasov, Pavel V., Sogoyan, Armen V., Tararaksin, Alexander I., Vasil'ev, Alexey L., Anashin, Vasily S., Chubunov, Pavel A.
Published in 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2013)
Published in 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2013)
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Conference Proceeding
Local laser irradiation technique for SEE testing of ICs
Chumakov, A. I., Pechenkin, A. A., Savchenkov, D. V., Tararaksin, A. S., Vasil'ev, A. L., Yanenko, A. V.
Published in 2011 12th European Conference on Radiation and Its Effects on Components and Systems (01.09.2011)
Published in 2011 12th European Conference on Radiation and Its Effects on Components and Systems (01.09.2011)
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Conference Proceeding
Analysis of SOI CMOS microprocessor's SEE sensitivity: Correlation of the results obtained by different test methods
Gorbunov, M. S., Vasilegin, B. V., Antonov, A. A., Osipenko, P. N., Zebrev, G. I., Anashin, V. S., Emeliyanov, V. V., Ozerov, A. I., Useinov, R. G., Chumakov, A. I., Pechenkin, A. A., Yanenko, A. V.
Published in 2011 12th European Conference on Radiation and Its Effects on Components and Systems (01.09.2011)
Published in 2011 12th European Conference on Radiation and Its Effects on Components and Systems (01.09.2011)
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Conference Proceeding